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Electrical semiconductor characterization
Luminescence dating, research, dosimetry and more
Contamination monitor, beta-aerosol monitor, dose rate meter and more
Mono- and Multi-crystalline wafer lifetime measurement device
State of the art system for topographic electrical characterization of multicrystalline bricks in fabs with high throughput....
Production integrated high speed wafer mapping of carrier lifetime. Single wafer topograms in less than one second a wafer.
Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different...
Mono- and Multi-crystalline wafer and brick lifetime measurement device
Flexible OEM unit for lifetime measurements at a variety of different samples ranging from mono- to multicrystalline silicon...
Microwave Detected Photo Induced Current Transient Spectroscopy
The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore...
MDP is an advanced technology with a so far unsurpassed combination of sensitivity, speed and resolution for fab and lab...
for quality control of bifacial PERC/PERC+ solar cells and more
portable in field PID tester for solar modules
user friendly and advanced operating software
The PIDcon devices are designed to investigate the PID susceptibility for production monitoring of solar cells as well as tests...
Learn more about the reasons for PID and the how the susceptibility of solar cells, mini modules and encapsulation materials can...
For ultra-fast crystal orientation and rocking curve measurements
Flexible diffractometer for ultra-fast Omega Scan orientation determination
Smart diffractometer for ultra-fast Omega-scan of small samples.
Robust XRD equipment for fully automated in-line testing & alignment
for blanks, wafers & bars (AT, SC, TF, etc.)
three generations of X-ray engineers
in industrial production, R&D and more
discover the most convenient way of measuring orientation of single crystals
Our quality management system is an integrated process-oriented system with ISO 9001 certification.
Gancarczyk, K., Albrecht, R., Berger, H., Szeliga, D., Gradzik, A., and Sieniawski, J. (2017). Determination of Crystal Orientation by Ω-Scan Method in Nickel-Based Single-Crystal Turbine Blades.
W. Bogdanwicz, R. Albrecht, J. Sieniawski, K. Kubiak: The subgrain structure in turbine blade roots of CMSX-4 superalloy.
W. Bogdanwicz, R. Albrecht, A. Onyszko, J. Sieniawski: Characterization of Single-Crystal Turbine Blades by X-Ray Diffraction Methods.
B. Nestler, H.-J. Kuhr, G. Hildebrandt, H. Bradaczek: Novel use of a commercial goniometer for sorting round quartz blanks. Meas. Sci. Technol. 2 (1991), 528-531.
G. Hildebrandt, H. Bradaczek: Experiences with Quartz Oscillator Angle-Sorting. Cryst. Res. Technol. 37 (2002), 111-118.
H. Berger: Simulation of X-Ray Reflection Curves in Single Non-Coplanar Geometry and Its Application. Cryst. Res. Technol. 37 (2002), 716-726.
H. Berger: X-ray orientation determination of single crystals by means of the Ω-Scan Method. J. Phys. IV France 118 (2004), 37-4.
H. Berger, H.-A. Bradaczek, H. Bradaczek, “Omega-Scan: an X-ray tool for the characterization of crystal properties”, J. Mater. Sci.: Mater. Electron. 19 (2008) S351-S355
A. Onyszko, J. Sieniawski, W. Bogdanowicz, H. Berger: Two methods of studying structure perfection of single crystal nickel-based superalloy. Solid State Phenomena, 203-204 (2013), 177-180.