Publications

Publications

  • V. Naumann et al., The role of stacking faults for the formation of shunts during potential induced degradation (PID) of crystalline Si solar cells, Phys. Stat. Solidi RRL 7, No. 5 (2013) 315-318

  • P. Hacke et al., Proc. Of 25th EUPVSC Valencia, Spain (2010)

  • S. Pingel et al. Proc. Of 35th IEEE PVSC, Honululu, USA (2010)

  • V. Naumann et al., Solar Energy Materials and Solar Cells Vol. 120 (2014), 383-389

  • V. Naumann et al., On the discrepancy between leakage currents and potential induced degradation of crystalline silicon modules, Proc. 28th PVSEC (2013), 2994-2997

  • V. Naumann et al., Potential-Induced Degradation at Interdigitated Back Contact Solar Cells, Energy Procedia (2014)