SDCOM

for ultra-fast crystal orientation measurement using the Omega-scan method

Smart X-ray Diffractometer for Crystal Orientation Measurement (SDCOM), especially designed for small crystals

Features of SDCOM

  • Ability to measure very small crystals down to 1 mm or larger samples

  • Variety of sample holders and transfer fixtures towards wire saw, grinding, etc.

  • Marking option of lateral crystal direction

  • No water cooling

  • Highest precision: 0.01° (depending on crystal quality)

  • Determination of the complete lattice orientation of single crystals

  • Ultra-fast crystal orientation measurement using the Omega-scan method

  • Air cooled X-ray tube, no water cooling required

  • Appropriate for research and production quality control

  • manual handling (no automation option)

Crystal orientation is determined by reflex position
suitable for a vast variety of materials

Examples of measurable materials

  • Cubic / arbitrary unknown orientation: Si, Ge, GaAs, GaP, InP

  • Cubic / special orientation: Ag, Au, Ni, Pt, GaSb, InAs, InSb, AlSb, ZnTe, CdTe, SiC3C, PbS, PbTe, SnTe, MgO, LiF, MgAl2O4, SrTiO3, LaTiO3

  • Tetragonal: MgF2, TiO2, SrLaAlO4

  • Hexagonal / Trigonal: SiC 2H, 4H, 6H, 15R, GaN, ZnO, LiNbO3, SiO2 (quartz), Al2O3 (sapphire), GaPO4, La3Ga5SiO14

  • Orthorhombic: Mg2SiO4, NdGaO3

  • Further materials according to the customers' demands