Projects

TemCrysT – GaN-Templates, GaN-Crystals and GaN-Wafers for the Development of GaN-Transistors

2023/07/01 – 2026/03/06

The aim of this project is to develop stress-adapted seeds, larger GaN bulk crystals and wafers as well as an automated characterization method for process control based on Raman measurements. Since basic industrial research is still necessary for this, this project aims to secure and expand the competitiveness of the semiconductor location Freiberg. For this purpose, Freiberg Instruments will work together with the Freiberger Compound Materials GmbH and NaMLab gGmbH to develop a demonstrator for a fully automated confocal Raman measurement. This is used to analyze residual stresses, which naturally occur in the crystals due to the hetero-epitaxy process used and represent a central parameter. In this way, excellent feedback should be achieved along the entire process chain. In addition, the MDP method (microwave-detected photoconductivity), which has been established for silicon up to now, is to be applied to large HVPE GaN crystals for the first time and the possibilities of defect analysis on this material are to be researched and demonstrated. Furthermore, the capabilities of the newly developed SPV spectrometer (surface photovoltage) are to be adapted to HVPE-GaN so that this device can be used for material characterization.

Contact person:

Dr. Nadine Schüler (schueler(at)freiberginstruments.com)


G12 - Silicon mono-wafer development from M2 to G12: Cell geometries of the future

2022/04/01 – 2025/03/31

Development of the MDP lifetime measurement technology for monocrystalline bricks with a format of up to 210 x 210 mm

The main goal of the "G12" project is the process and technology development of ingots and wafers with large format (formats (182x182 mm, 210x210 mm, possibly even 240x240 mm). The production of large ingots and large wafers requires further development of the crystallization systems, the process control, the mechanical processing of the ingot and bricks and ultimately also the qualification tools for the manufactured bricks and wafers. The focus of the sub-project at Freiberg Instruments is on the further development of lifetime measurements using MDP technology for large brick formats.

Contact person:

Dr. Nadine Schüler (schueler(at)freiberginstruments.com)


Semicon

2021/03/01 – 2024/02/29

In this project a fast, contactless characterization tool based on THz is developed for the measurement of doping density, sheet resistance and layer thickness of thin semiconductor layers.

Contact person:

Dr. Nadine Schüler (schueler(at)freiberginstruments.com)


SALSA - Measurement technology and sensitivity analysis for charge carrier selective solar cells

2021/04/01 – 2024/03/31

In the "SALSA" project, the inline measurement technology required for quality assurance and process control as well as quality assurance concepts are to be developed, optimized and techno-economically evaluated especially for progressive solar cell technologies such as the heterojunction route and the TOPCon route. 
The focus of Freiberg Instruments is on further development of their inline lifetime measurement abilities using MDP for HJT and TOPcon technology. The main tasks are:
(1) System optimization for TopCon and HJT (inline - MDPlinescan, offline - MDPmap)
(2) Identification of suitable excitation conditions in different manufacturing stages (TOPCon / HJT)
(3) Detectability of defects in selected process stages
(4) Development of a concept for an optimized MDPline scan system

Contact person:

Dr. Nadine Schüler (schueler@freiberginstruments.com)


SPV - Development of a surface photovoltage spectrometer for the characterization of photoactive materials

2021/01/01 – 2022/12/30

So far, there are no universally applicable compact SPV spectrometers (SPV: surface photovoltage) available on the market with which practically any photoactive materials and semiconductors can be examined. The aim of this project is to develop a compact SPV spectrometer. With the help of our innovative SPV spectrometer and the measurement set-up for which a patent has been applied, charge separation, electronic transitions and diffusion lengths should be characterized contactless and with unprecedented sensitivity over a very broad spectral range from deep UV to near infrared.

In accordance with the complementary strengths of the project partners, the focus of Freiberg Instruments is on device development and production of the demonstrator, of HZB on method development, development of critical components, validation and tests, and HZG on simulation and development of analysis and simulation software for SPV.

Contact person:

Dr. Nadine Schüler (schueler@freiberginstruments.com)


Technology transfer PIDcon bifacial

Technology transfer PIDcon bifacial

2020/07/01 – 2020/12/31

In this project, the novel technology for testing bifacial solar cells for their sensitivity to potential-induced degradation (PID) is to be transferred from the Fraunhofer Center for Silicon Photovoltaics CSP to Freiberg Instruments GmbH and adapted into a marketable product. The Fraunhofer CSP has applied for a patent for a novel process (process and arrangement for testing solar modules or solar cells for potential-induced degradation) and will transfer this knowledge to Freiberg Instruments.

This project is funded by SAB and the EU.

Contact person:

Dr. Nadine Schüler (schueler@freiberginstruments.com)

 

QualiZell mess-ODNP

QualiZell mess-ODNP

2019/11/01 – 2021/10/30

In cooperation with the technical university Bochum, Freiberg Instruments is developing a tool for ODNP measurements, a combination of EPR and NMR for the investigation of water dynamics and protein function.
This project is funded within the ZIM network “Qualitätskontrolle Zelltherapie” (https://www.qualitaetskontrolle-zelltherapie.de/) by ZIM and the German government.

Contact person:

Dr. Nadine Schüler (schueler@freiberginstruments.com)

µTHIN

µTHIN

2019/09/01 – 2021/08/31

The objective of this project is to develop a sensor for sheet resistance measurements on thin films of e.g. GaN on Si via microwave detection. Furthermore, the MDP technology will taken to its next level concerning the time resolution, sensitivity and mapping possibility at different temperatures. The project partner the technical university Freiberg, is correlating the results of the new sensor and the improved MDP with PL and Raman measurements to gain new insights in the interpretation of the measurements results.


This project is funded out of the EFRE fond of the EU.

Contact person:

Dr. Nadine Schüler (schueler@freiberginstruments.com)

 


Omega-Scan

Advancement of Omega-Scan technology for different applications

2018/01/01 – 2020/12/31

Freiberg Instruments is further advancing its Omega-Scan technology for orientation of single crystals for different applications as orientation of diamond and other wide bandgap semiconductors, epitaxial layers, turbine blades and quartz.


The project is funded by the SAB and the EU.

Contact person:

Dr. Nadine Schüler (schueler@freiberginstruments.com)
Dr. Hans-Arthur Bradaczek (bradaczek@freiberginstruments.com)

 


PIDrecovery

2018/01/01 – 2020/12/31

Freiberg Instruments takes part in a project with the goal to develop a method to predict PID recovery and hence the efficiency of a module. Freiberg Instruments is further developing its tool PIDcheck for the PID test of modules in free field and its recovery.


The project is funded by BMWi.

Contact person:

Dr. Nadine Schüler (schueler@freiberginstruments.com)

 


Smart3 | materials – solutions – growth

2017/05/01 – 2020/04/30

Smart processes – process technology for smart materials
MSM-production and material characterization

Freiberg Instruments is investigating the applicability of x-ray diffraction methods for crystallographic orientation determination on MSM single crystals (Magnetic Shape Memory) in subproject 2 "Process chains for the production of MSM actuator sticks". In the case of a positive evaluation, the closer connection to the subsequent processing steps will be examined and the determination process will be automated.

 

The project is funded by the BMBF within the Funding project “Zwanzig20”.

Contact person:

Dr. Nadine Schüler (schueler@freiberginstruments.com)
Dr. Hans-Arthur Bradaczek (bradaczek@freiberginstruments.com)

 


Q-Crystal

2017/01/01 – 2019/12/31

The overall objective of this project is to optimize the production processes of block silicon under industrial conditions with the help of fast and novel methods of quality assessment of bricks and wafers and thus to increase the quality of silicon wafers produced therefrom. This is to be demonstrated by a highly efficient industrial solar cell structure. Freiberg Instruments cooperates in this project with 7 partners from industry and Fraunhofer society.

This project is funded by BMWi.


Contact person:

Dr. Nadine Schüler (schueler@freiberginstruments.com)


SEA4KET

2013/11/01 – 2017/04/30

The aim of this project is the evaluation of different metrology components for 450 mm wafers. Freiberg Instruments is delivering a measurement head for high resolution lifetime measurements in this project.

Contact person:

Dr. Kay Dornich
E-Mail: dornich@freiberginstruments.com


CUT-B

2015/12/01 – 2018/11/30

The objective of this project is to evaluate and improve the cutting edge characterization and technology for the german photovoltaic industry. The main focus are inline metrology tools and the prediction of solar cell efficiency by means of different measured parameters.

Freiberg Instruments is involved in this project with its inline metrology tool MDPinline. The aim is to improve the possibilities of solar cell efficiency prediction via lifetime measurements on wafers after different process steps. Further more typical errors in different process steps are investigated to enable an automatic detection.

This project is supported by BMWi.

Contact person:

Dr. Nadine Schüler
E-Mail: schueler@freiberginstruments.com


WIDE

2016/01/01 – 2018/12/31

This project involves Freiberg Instruments and the TU Freiberg and has the goal to improve the scientific tool MDPmap for the measurement of wide bandgap semiconductors. This includes

  • Improvement of the time resolution, in order to be able to measure also small lifetimes (> 10 ns)

  • Improvement of the sensitivity

  • Enhancement of temperature range up to 800 K for the investigation of deep defects

This project is funded by SAB and the EU.

Contact person:

Dr. Nadine Schüler
E-Mail: schueler@freiberginstruments.com


PIDcheck

2016/03/07 – 2017/06/06

This is a funded technology transfer project, in which Freiberg Instruments in cooperation with the Fraunhofer Institute CSP in Halle is developing a PID test tool for the test of modules in free field.

This project is funded by the SAB and the EU.

Contact person:

Dr. Nadine Schüler
E-Mail: schueler@freiberginstruments.com

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