DDCOM

for ultra-fast crystal orientation measurement using the Omega-scan method

The Desktop X-ray Diffractometer for Crystal Orientation Measurement (DDCOM) is an automated tool to determine the orientation of various crystals using the Omega-scan method.

Ultra-fast Omega-scan approach

  • 200 times faster than Theta-scan method

  • Automatic evaluation of the complete lattice orientation in 3D

  • Determination of entire crystal orientation within 5 seconds

Compact, user friendly and cost effective

  • Easily movable and lightweight desktop design

  • Convenient sample handling and easy to operate

  • Low energy consumption and operating costs due to air cooled X-ray tube (no water cooling required)

Efficient workflows for quality control

  • For standard research and industrial workflows

  • Azimuthal setting and marking of crystal orientation

  • Preprogrammed cubic crystal parameters

  • State-of-the-art and convenient software

  • High precision, i.e up to (1/100)°

Control of cutting, grinding and lapping

  • Complete lattice orientation of single crystals

  • Suitable for a unique variety of materials in a large range of size and weight, such as: Wafers from 2-12” and Ingots up to 20kg


Highlights

  • Determination of the complete lattice orientation of single crystals

  • Ultra-fast crystal orientation measurement using the Omega-scan method

  • Determination of the arbitrary unknown orientation of cubic crystals

  • Designed especially for azimuthal setting and marking of lattice directions

  • Air cooled X-ray tube, no water cooling required

  • Appropriate for research and production quality control

Omega-scan diagram (Quartz)
easy sample allignment
suitable for a vast variety of materials
 

Technical specifications

X-ray source30 W air-cooled X-ray tube, Cu anode
DetectorsTwo scintillation counters
Sample holderPrecise turntable, setting accuracy 0.01°, tools for defined sample positioning and marking
Dimensions600 mm × 600 mm × 850 mm
Weight80 kg
Power supply100-230 V, 100 W, single phase
Room temperature≤ 30° C

Examples of measurable materials

  • Cubic / arbitrary unknown orientation: Si, Ge, GaAs, GaP, InP

  • Cubic / special orientation: Ag, Au, Ni, Pt, GaSb, InAs, InSb, AlSb, ZnTe, CdTe, SiC3C, PbS, PbTe, SnTe, MgO, LiF, MgAl2O4, SrTiO3, LaTiO3

  • Tetragonal: MgF2, TiO2, SrLaAlO4

  • Hexagonal / Trigonal: SiC 2H, 4H, 6H, 15R, GaN, ZnO, LiNbO3, SiO2 (quartz), Al2O3 (sapphire), GaPO4, La3Ga5SiO14

  • Orthorhombic: Mg2SiO4, NdGaO3

  • Further materials according to the customers' demands

Options

  • Device for mapping of wafers (maximum diameter 225 mm)

  • Device for automatic loading from cassettes

Omega-scan method

All desired crystal orientation parameters are captured in one rotation within 5 seconds.
Device for mapping of wafers
Device for automatic loading from cassettes