Electrical Characterization

The performance of semiconductor devices depends fundamentally on key electrical parameters of the material and therefore also on defect densities and their electrical properties. 

Electrical characterization – important material parameters

The performance of semiconductor devices depends fundamentally on key electrical parameters of the material and therefore also on defect densities and their electrical properties. With the development of the advanced method MDP (microwave detected photoconductivity) it is possible to measure these very important electrical parameters with so far not achieved sensitivity, resolution and speed.