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Electrical semiconductor characterization
Luminescence dating, research, dosimetry and more
Free radical measurements in life science and biomedical applications
Offline tool for very versatile contactless electrical characterization of semiconductor wafers or partially processed wafers....
State of the art system for topographic electrical characterization of multicrystalline bricks in fabs with high throughput....
Production integrated high speed wafer mapping of carrier lifetime. Single wafer topograms in less than one second a wafer.
Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different...
Mono- and Multi-crystalline wafer and brick lifetime measurement device
Flexible OEM unit for lifetime measurements at a variety of different samples ranging from mono- to multicrystalline silicon...
is a modification of MDP, where temperature dependent measurements of the defect part of the transient are accomplished.
The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore...
MDP is an advanced technology with a so far unsurpassed combination of sensitivity, speed and resolution for fab and lab...
benchtop PID test solution
for fast and routine production level quality control of solar cells
user friendly and advanced operating software
The PIDcon devices are designed to investigate the PID susceptibility for production monitoring of solar cells as well as tests...
Learn more about the reasons for PID and the how the susceptibility of solar cells, mini modules and encapsulation materials can...
for ultra-fast crystal orientation and rocking curve measurements
flexible diffractometer for ultra-fast Omega Scan orientation determination
for AT, SC, FC, IT cut Blanks
three generations of X-ray engineers
in industrial production, R&D and more
discover the most convenient way of measuring orientation of single crystals
The microelectronic industry drives present global technological developments. It is one reason for the success of information...
Solar Energy is one of the key elements for the energy revolution that is currently taking place all over the world. In the last...
Research and development is the driving force for the expanding market for semiconductor products in the PV and microelectronic...
The impact of the development of the crystal growth methods on modern technology is often underestimated. We use products...
Freiberg Instruments is one of the world's fast growing, young and dynamic analytical instrumentation companies
Technical support, Training, Warranty, Consultation, Seminars, Upgrades and more
Our quality management system is an integrated process-oriented system with ISO 9001 certification.
going the extra mile
at Freiberg Instruments
Freiberg Instruments designs single crystal diffractometers and automated systems for crystal lattice orientation and rocking curve measurements. We specialize in the ultra-fast and precise Omega Scan orientation determination method. Our partners of GNR Analytical Instruments Group offer a highly differentiated palette of X-ray products for a broader range of applications.
The quality criteria for crystalline wafer surfaces often demand a precise relation between surface orientation and the crystalline orientation of the material. XRD techniques are used during production process to align the crystals for sawing, to determine the flat position and to check the orientation of the final product.
The Omega Scan is a fast way of determining the complete lattice orientation with high precision in only one measurement step. An approximate orientation of the measured surface is required as input, for example the orientation known from the seed crystal.
Our diffractometers are intended for macroscopic single crystals from 1 mm up to 400 mm in size. Available options are the Omega scan and Theta scan orientation methods, as well as rocking curve measurement. A laser optical tilt detection can be applied if the correction of the reference surface is required. Various extensions have been developed for special functions, for example an automatized handling system, a flat detection optics system or a secondary monochromator for reciprocal space mapping applications.
for ultra-fast crystal orientation and rocking-curve measurements
for ultra-fast crystal orientation using Omega Scan method
for AT, SC, TC, IT cut blanks