Spatially Resolved Single Grain Analysis using EMCCD
UV to NIR (200 – 1050 nm) image detection for spatially resolved / single-grain measurement
operational at the TL/OSL or RF measurement position
512 x 512 pixel back-thinned, UV-coated EMCCD chip (electron multiplying – EM - technology), 16 bit resolution, frame – transfer format
operates also in traditional CCD mode (low noise)
max. frame rate: > 33 frames/second (full frame)
gigabit Ethernet data interface
high quantum efficiency from UV to NIR : approx. 50% @ UV Quartz OSL emission peak; approx. 85-90 % @ all VIS Quartz/Feldspar emission peaks; approx. 60% @ potassium feldspar NIR RF peak (865 nm)
~8 mm diameter sample is imaged on the camera chip (ca. 16 μm / pixel)
incl. electromechanical shutter
TE cooling min. -95 °C (-70 °C guaranteed for life), thermostatic precision ± 0.05°C
integration into lexsyg measurement control software