Omega/Theta XRD

for ultra-fast crystal orientation, crystal alignment in production, quality control, rocking curve measurements, material research and more

Si | SiC | AlN | GaAs | Quartz | LiNbO3 | BBO and 100 more materials

Ingot XRD

Ingot Alignment System

state-of-the-art XRD system for automatic single crystal ingot orientation, tilting and alignment for grinding

Wafer XRD

for fully automated sorting, crystal orientation, optical notch and flat determination and more

Si | SiC | AlN | Sapphire (Al2O3) | GaAs | Quartz | LiNbO3 | BBO and 100 more materials

MDPmap

Mono- and Multi-crystalline wafer lifetime measurement device

for sophisticated material research & development

MDpicts

for contactless and temperature dependent lifetime and LBIC measurements

Si | compound semiconductors | oxides | wide bandgap materials | perovskites | epitaxial layers

PIDcon bifacial

for quality control of bifacial PERC/PERC+ solar cells and more

Omega/Theta XRD

Ingot XRD

Wafer XRD

MDPmap

MDpicts

PIDcon bifacial

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