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Electrical semiconductor characterization
Luminescence dating, research, dosimetry and more
Mono- and Multi-crystalline wafer lifetime measurement device
State of the art system for topographic electrical characterization of multicrystalline bricks in fabs with high throughput....
Production integrated high speed wafer mapping of carrier lifetime. Single wafer topograms in less than one second a wafer.
Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different...
Mono- and Multi-crystalline wafer and brick lifetime measurement device
Flexible OEM unit for lifetime measurements at a variety of different samples ranging from mono- to multicrystalline silicon...
Microwave Detected Photo Induced Current Transient Spectroscopy
The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore...
MDP is an advanced technology with a so far unsurpassed combination of sensitivity, speed and resolution for fab and lab...
benchtop PID test for solar wafers and mini-modules
for quality control of bifacial PERC/PERC+ solar cells and more
portable in field PID tester for solar modules
user friendly and advanced operating software
The PIDcon devices are designed to investigate the PID susceptibility for production monitoring of solar cells as well as tests...
Learn more about the reasons for PID and the how the susceptibility of solar cells, mini modules and encapsulation materials can...
For ultra-fast crystal orientation and rocking curve measurements
Flexible diffractometer for ultra-fast Omega Scan orientation determination
Smart diffractometer for ultra-fast Omega-scan of small samples.
Robust XRD equipment for fully automated in-line testing & alignment
for blanks, wafers & bars (AT, SC, TF, etc.)
three generations of X-ray engineers
in industrial production, R&D and more
discover the most convenient way of measuring orientation of single crystals
Our quality management system is an integrated process-oriented system with ISO 9001 certification.
November 16, 2018
Freiberg Instruments today announced that it is doubling its production capacity via an addition to its headquarters building in Freiberg, Germany. The building addition will house not only an additional modern area for production assembly and test but also a fully automatic CNC machine facility. Occupancy will be complete by early December. The new building was completed ahead of Freiberg Instruments’ original timetable and within the overall project budget. The construction cost of this project is co-financed with tax revenue on the basis of the budget adopted by the members of the Parliament of Saxony.
In a statement on the completion of the new building, Freiberg Instruments’ CEO & Founder Dr. Kay Dornich said:"I am extremely pleased to see the completion of this addition to our headquarters. The new production facility will enable us to gather all production and application staff in one building, and we will reduce our overall costs and our lead time by reducing our dependence on outside suppliers. The completion of the new building within Freiberg Instruments’ original timetable and project budget is consistent with our drive to strengthen the effectiveness and efficiency of the company’s internal operations." Freiberg Instruments is known as an innovative supplier of X-ray diffraction equipment, carrier lifetime characterization systems, ESR spectrometers, TL/OSL readers, and PID test equipment. The company has grown rapidly since its founding in 2005 and now has an installed base of equipment of well over 1,000 systems in more than 23 countries around the world.
For more information, contact Mr. Thanga Kumar, Head of Sales & Marketing, at firstname.lastname@example.org.
Freiberg Instruments GmbH
Delfter Str. 6
D-09599 Freiberg, Saxony
Tel: +49 3731 41954 0