Choose another division
Electrical semiconductor characterization
Luminescence dating, research, dosimetry and more
Mono- and Multi-crystalline wafer lifetime measurement device
State of the art system for topographic electrical characterization of multicrystalline bricks in fabs with high throughput....
Production integrated high speed wafer mapping of carrier lifetime. Single wafer topograms in less than one second a wafer.
Low cost table top lifetime measurement system for characterization of a variety of different silicon samples at different...
Mono- and Multi-crystalline wafer and brick lifetime measurement device
Flexible OEM unit for lifetime measurements at a variety of different samples ranging from mono- to multicrystalline silicon...
Microwave Detected Photo Induced Current Transient Spectroscopy
The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore...
MDP is an advanced technology with a so far unsurpassed combination of sensitivity, speed and resolution for fab and lab...
benchtop PID test for solar wafers and mini-modules
for quality control of bifacial PERC/PERC+ solar cells and more
portable in field PID tester for solar modules
user friendly and advanced operating software
The PIDcon devices are designed to investigate the PID susceptibility for production monitoring of solar cells as well as tests...
Learn more about the reasons for PID and the how the susceptibility of solar cells, mini modules and encapsulation materials can...
For ultra-fast crystal orientation and rocking curve measurements
Flexible diffractometer for ultra-fast Omega Scan orientation determination
Smart diffractometer for ultra-fast Omega-scan of small samples.
Robust XRD equipment for fully automated in-line testing & alignment
for blanks, wafers & bars (AT, SC, TF, etc.)
three generations of X-ray engineers
in industrial production, R&D and more
discover the most convenient way of measuring orientation of single crystals
Our quality management system is an integrated process-oriented system with ISO 9001 certification.
January 10, 2020
Following a very successful 2018 and 2019, Freiberg Instruments looks to continue its global growth with the opening of new office in January 2020.
The new office in Shanghai marks an important move into mainland China for the business. It will help bring it closer to its existing clients and enable it to work with many other innovative companies, research institutes and universities across China and South East Asia.
Freiberg Instruments' CEO & Founder, Dr. Kay Dornich speaks of his enthusiasm, “Freiberg Instruments can see the exponential and enormous opportunities in China and South East Asia. I am thrilled to have an office opening that will surely offer more depth to our capabilities as we support growing Single Crystal Growth and Processing industries in the region.”
Freiberg Instruments is known as an innovative supplier of X-ray diffraction systems, carrier lifetime characterization equipment, TL/OSL readers and PID test equipment. The company has grown rapidly since its founding in 2005 and now has an installed base of equipment of well over 1,200 systems in more than 30 countries around the world.
For more information, contact Mr. Thanga Kumar, Head of Sales & Marketing, at email@example.com. Corporate Headquarters Freiberg Instruments GmbH Delfter Str. 6 D-09599 Freiberg Germany
Shanghai Office Freiberg (Shanghai) Instruments Co., Ltd.
No.1333 Xinlong Road, No. 30 Building, Room 810 Shanghai Minhang District, China People's Republic of China