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Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products X-ray Diffraction Omega/Theta XRD Omega/Theta - Customized sample holders Customized sample holders Fixtures for tiny cylinders, large ingots or cubes for crystal orientation Interested? Get in touch! Contact now Sample stage for large samples for large samples up to 590 mm diameter max. sample mass = 30 kg additional fixtures for complex sample geometry on request Special holders for small samples fixing of small samples quick & easy sample placement simply exchangeable with other holder

Omega-scan Ultra-Fast Orientation Measurement for Single Crystals Advantages of the Omega-Scan Method Stable and Simplified Setup The X-ray tube and detector remain fixed, requiring only a single measuring circle and no monochromator. Comprehensive Data Collection All necessary data for full orientation determination is captured in just one rotation. High Precision with Minimal Measurement Time The method delivers exceptional accuracy within a short measurement duration. These features make the Omega-Scan method particularly well-suited for routine measurements and industrial applications, where speed and reliability are essential. Understanding the Omega-Scan Method The Omega-Scan technique involves rotating the specimen 360° around a specific axis, such as the surface normal. The X-ray source and detector are positioned based on the crystal type to ensure an optimal number of reflections per turn. By analyzing the angular positions of these reflections, the crystal lattice orientation is determined in relation to the rotation axis. To precisely align the lattice orientation with the crystal surface, a laser beam checks the surface direction. Other relevant reference planes or directions can also be measured using optical tools. This technique enables accurate orientation measurement of single crystals in any configuration, achieving a reproducibility within a few arc seconds—often in just a few seconds of measurement. A specialized application of the Omega-Scan method is precision lattice-parameter determination , particularly for cubic crystals, providing highly accurate structural insights. Related Applications: Crystal Surface Orientation Mapping , 3D Mapping of Crystalline Turbine Blades , Quartz Bar Aligning , Automatic Wafer Sorting , Quartz Blank Sorting , Samples with a wide variety of geometry & size , Marking and measuring of in-plane directions , Crystal quality , NLO Materials: Crystal Quality & Optical Axis Orientation Matching Products XRD series Ingot XRD Enables existing equipment to reach high-end OD/Notch specs for 200 mm and 300 mm ingots Learn more XRD series Wafer XRD for fully automated sorting, sample crystalline orientation, sample dimension, optical notch/flat and edge profile determination and more Learn more XRD series Omega/Theta XRD for ultra-fast crystal orientation, crystal alignment in production, quality control, rocking curve measurements, material research and more Learn more XRD series DDCOM Ultra-fast, bottom surface measuring crystal orientation in a compact package Learn more XRD series SDCOM Ultra-fast, top surface measuring crystal orientation in a compact package Learn more XRD series XRD-OEM Fully automated in-line orientation and handling of ingots, boules, and pucks Learn more XRD series Ingot XRD SiC Enables existing equipment to reach high-end OD/Notch specs. Learn more XRD series Quartz Bar XRD Enable tight frequency specs in mass production Learn more XRD series Quartz Wafer XRD Enable tight frequency specs in mass production Learn more XRD series Quartz Blank XRD Enable tight frequency specs in mass production Learn more XRD series XRDmap Pro Inline wafer orientation mapping truly fab compliant Learn more XRD series Angle Sorter This product launching soon Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

OSLdosimetry OSLdosimetry is a user friendly operating software which allows OSL dose measurements as standard user or calibration and setting features for professionals (password protected). The OSLdosimetr y software provides individual dosimeter sensitivity calibration which makes the dose reading very precise. Additionally it include the history of OSL dosimeters e.g. OSL life time dose number of OSL readings last OSL read out etc. Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry myOSLraser myOSLraser 4.0 OSL single detector OSL single detector The single detectors can be used in our finger ring or eye lens dosimeter. Interested? Get in touch! Contact now Our OSL single detector based on BeO are marced with unique number and related 2D code which will be identified in our myOSLraser with a special barcode scanner. Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry myOSLraser myOSLraser 4.0 OSL Extremity and Eye lens dosimeter OSL Extremity and Eye lens dosimeter OSL Extremity and Eye lens dosimeter Interested? Get in touch! Contact now Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

News Stay informed about how we’re shaping the future of automation and metrology Discover Our Latest Updates 11/05/2024 HZB patent for semiconductor characterisation goes into serial production HZB team has developed together with Freiberg Instruments an innovative monochromator that is now being... 12/07/2023 Collaboration Announcement: Freiberg Instruments and Ajuba Collaboration Announcement: Freiberg Instruments and Ajuba Join Forces for Semiconductors Ecosystem for... 11/21/2023 TL/OSL series A precision better than 1% is achievable with lexsygsmart luminescence reader Al2O3:C film OSLD can be measured with lexsyg smarts with a precision better than 1% over a 0.2 Gy–10 Gy dose... 10/30/2023 Press release: Malvern Panalytical acquires six X-ray diffraction (XRD) instruments Malvern Panalytical, a leading analytical instrumentation supplier, today announces it has acquired the... 02/10/2023 Press release: New production floor tool Press release: New production floor tool for fast and accurate semiconductor quality control and... 11/05/2021 TL/OSL series Freiberg researchers open joint laboratory for luminescence research For more information please visit,... 03/23/2021 Press release: Freiberg Instruments receives TOP 100 seal March 23, 2021 Freiberg - Award-winning innovation: Freiberg Instruments GmbH from Freiberg (Saxony) has... 03/23/2021 TL/OSL series Press release: Freiberg Instruments receives TOP 100 seal March 23, 2021 Freiberg - Award-winning innovation: Freiberg Instruments GmbH from Freiberg (Saxony) has... 03/01/2021 TL/OSL series New method developed with a lexsyg research to estimate the dose and time elapsed since a radiation accident A new method was developed with Freiberg Instruments' lexsyg research luminescence reader for emergency... 11/26/2020 Press release: Freiberg Instruments opening new office in Shanghai Press release: Freiberg Instruments kicks off 2020 with opening of new office in Shanghai January 10,... 01/21/2020 TL/OSL series Past human movement into Europe dated with a lexsygsmart TL/OSL reader Measurements with a Freiberg Instruments’ lexsygsmart TL/OSL reader build the backbone of a study which found... 11/16/2018 Press release: Freiberg Instruments Expands Its Production Capacity November 16, 2018 Freiberg Instruments today announced that it is doubling its production capacity via an... 11/16/2018 TL/OSL series Press Release: Freiberg Instruments Expands Its Production Capacity November 16, 2018 Freiberg Instruments today announced that it is doubling its production capacity via an... 07/27/2015 TL/OSL series Press release: Freiberg Instruments GmbH certified with ISO 9001:2008 accreditation Freiberg – October 10, 2014 – Freiberg Instruments GmbH is pleased to announce that it has successfully... Stay Connected on LinkedIn Follow Freiberg Instruments on LinkedIn for weekly updates, exclusive product showcases, and industry insights. Join our community to stay informed about the latest innovations and milestones shaping the future of automation and metrology. Don’t miss out – be part of the conversation! Discover Us on LinkedIn Discover more Our people Learn more Quality and Certification Learn more Contact Learn more

Neutron dosimetry Accelerators, space dosimetry, high-LET Active dosimeters, like rem-mteters, superheated emulsions and electronic personal dosemeters can be used to measure neutron fields. But frequently passive dosemeters are used to determine equivalent doses in neutron fields from particle accelerators for quantitative and qualitative measurement. Especially Thermoluminescence (T) with LiF-dosemeters and recently Photo Stimulated Luminescence (PSL) with AlO- and LiB-dosemeters (see TL, OSL, PSL, Clinical dosimetry) are studied for radiation protection purposes and the determination of neutron irradiation doses. Agosteo, S. (2010). Overview of novel techniques for radiation protection and dosimetry. Radiation Measurements 45, 1171-1177. Kulkarni, M. S., Luszik-Bhadra, M., Muthe, K. P., Behrens, R., Rawat, N. S., Soni, A., Mishra, D. R., Gadkari, S. C., Gupta, S. K., and Sharma, D. N. (2014). New OSL detector combination for albedo neutron dosimetry. Radiation Measurements 71, 505-508. Response of passive detectors (Hp(10)) to various neutron energies (from Kulkarni et al., 2014) Matching Products TL/OSL series TLDcube A modern TLD reader by Freiberg Instruments Learn more TL/OSL series lexsygresearch The most advanced TL/OSL reader Learn more TL/OSL series lexsygsmart The most sensitive TL/OSL reader Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

NLO Materials Crystal Quality & Optical Axis Orientation Non-Linear Optical (NLO) Materials Unlike typical inorganic metals, semiconductors, and insulators, NLO materials feature more complex crystal structures with lower symmetry. This structure creates a highly anisotropic environment for light passing through the crystal, resulting in unique optical properties. These crystals are typically cut into small bars, with millimeter-scale dimensions, to serve as active components in frequency multipliers and optical parametric oscillators. Surface quality analysis of these small crystals can reveal structural defects and cracks. The large unit cells of NLO materials present a challenge for measurement, but the Omega Scan method has been successfully adapted to determine key parameters for important NLO materials like LBO, BBO, and TeO 2 . Special modifications to the Omega/Theta design enable NLO capabilities across a variety of materials, ensuring precise and reliable analysis. Related Technologies: Omega-scan Matching Products XRD series SDCOM Ultra-fast, top surface measuring crystal orientation in a compact package Learn more XRD series Omega/Theta XRD for ultra-fast crystal orientation, crystal alignment in production, quality control, rocking curve measurements, material research and more Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Mobility The mobility is a quantity related to the drift velocity of electrons or holes in an applied electric field across a material. The mobility depends on different scattering processes that can decelerate the free carriers, like collisions with the latt Mobility The mobility is a quantity related to the drift velocity of electrons or holes in an applied electric field across a material. The mobility depends on different scattering processes that can decelerate the free carriers, like collisions with the lattice or scattering at crystal defects and impurities. \(\cfrac{1}{\mu} = \cfrac{1}{\mu_{lattice}} + \cfrac{1}{\mu_{impurities}}\) Hence the mobility depends on the doping and defect density as well as the injection level. In our simulations and measurements we usually apply the model of DORKEL and LETURQUE [1]. [1] J. M. Dorkel and P. Leturcq, Solid-State Electronics 24, 821-825 (1981) Fig. 1: mobility for electrons and holes versus injection for different doping concentrations Matching Products MDP series MDPmap Precision Lifetime Charachterization with Exceptional Sensitivity Learn more MDP series MDPspot Quick and Simple Lifetime Measurement Made Easy Learn more MDP series MDpicts pro High-Resolution, Temperature-Dependent Lifetime Measurement System for Precise Material Characterization Learn more MDP series MDPpro 850+ Advanced Solution for Quality Control of Monocrystalline Silicon Ingots, Bricks, and Wafers Learn more MDP series MDPlinescan Versatile OEM Unit for Lifetime Measurements on Silicon Samples, from Bricks to Processed Wafers Learn more MDP series MDpicts Temperature-Dependent Lifetime Measurement System for Advanced Material Analysis Learn more RES series RESmap High-Precision Resistivity Mapping System for Accurate Material Analysis Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Minority carrier lifetime measurements on SiC In recent years the quality of SiC materials has improved profoundly and hence SiC is becoming more and more a competitor to Si for e.g. high-power devices. Since it is a wide-bandgap semiconductor, SiC has a number of advantages when compared to Si. The minority carrier lifetime is one of the fundamental parameters with regard to the performance of semiconductor devices, especially for the application of SiC in high voltage devices. Hence, it is necessary to perform lifetime engineering to gain the best performance of a certain device. In order to manufacture SiC devices with maximum yield, a material characterization with a high resolution is needed, together with a method to investigate the origin of defects in SiC to further improve the quality. The two contactless and destruction free methods microwave detected photoconductivity (MDP) and photo induced current transient spectroscopy (MD-PICTS) are ideal methods for material quality and defect characterization. The MDPmap combined with a UV-laser (355 nm) is the ideal tool for the spatial investigation of inhomogeneities in the minority carrier lifetime of SiC with a lower limit of 20 ns. MD-PICTS measurements enable the temperature dependent investigation of the photoconductivity transient allowing the determination of the defect activation energy and capture cross sections. With the MD-PICTS system it is possible to measure down to 85 K with a liquid nitrogen bath cryostat or even down to 4 K with a helium cooling system. The upper temperature limit is 800 K and hence also deep trap levels can be investigated. With the additional mapping option small samples (2 x 2 cm) can be mapped at different temperatures. Results Figure 1 and 2 show a minority carrier lifetime map and a photoconductivity transient of a 4H-SiC sample. Both was measured with the MDPmap with a resolution of 100 µm and a 355 nm laser. Figure 3 demonstrates a MD-PICTS spectrum with two detected defect levels with activation energies of 0.12 eV and 0.22 eV. The measurement was conducted with an MDpicts and a liquid nitrogen bath. For more information please read: B. Berger, N. Schüler, S. Anger, B. Gruendig-Wendrock, J. R. Niklas, K. Dornich, physica status solidi A, 1-8. Contactless electrical defectcharacterization in semiconductorsby microwave detected photo inducedcurrent transient spectroscopy (MD-PICTS) and microwave detected photoconductivity (MDP) Fig.1: Minority carrier lifetime map of a 4" SiC wafer Fig.2: Typical photoconductivity transient of a 4H-SiC sample Fig. 3: MD-PICTS spectrum of a 4H-SiC sample, with two trap levels Related Solutions and Industries: Epitaxial Layers & Thin Films Matching Products MDP series MDPmap Precision Lifetime Charachterization with Exceptional Sensitivity Learn more MDP series MDPspot Quick and Simple Lifetime Measurement Made Easy Learn more MDP series MDpicts Temperature-Dependent Lifetime Measurement System for Advanced Material Analysis Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com