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Resistivity Mapping High-Precision Resistivity Mapping for Accurate Material Analysis: The RES series Advanced resistivity mapping is essential for semiconductor quality control across materials like

Double Prism Monochromator Unlock the Future of Spectral Analysis: The DPM series Experience unparalleled optical performance with our state-of-the-art Wide-Range Double Prism Monochromator — engineer

Reference list – TL/OSL reader Indian subcontinent Ass.-Prof Dr Manoj Kumar Jaiswal, Department of Earth Sciences, Indian Institute of Science Education and Research, Kolkata, India Dr Manoj K. Rathor

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Luminescene dating, research, dosimetry Our R&D projects RAMSES-4-CE 04/2020 - 03/2024 Raman Absorption and eMission Spectroscopy in an intEgrated Sensor Circular Economy As a follow-up to the very su

Electrical semiconductor characterization Our R&D projects PERLE – Perovskite Tandem Solar Cells: Metrology for the PV Industry 2024/05/01 – 2027/04/30 In this project new methods for the inline chara

Driving efficiency and accuracy with our automation and metrology expertise Bringing Innovation from Lab to Fab At Freiberg Instruments, we drive technological advancements by developing high-precisio

Defects in 4H-SiC Investigated by surface photovoltage spectroscopy Defects in 4H-SiC investigated by surface photovoltage spectroscopy – power semiconductors Silicon carbide (SiC) high power, high vo

Marking and measuring of in-plane directions with Omega-scan Efficient Crystal Orientation and In-Plane Direction Measurement with Omega Scan The Omega Scan provides a complete crystal orientation in

NLO Materials Crystal Quality & Optical Axis Orientation Non-Linear Optical (NLO) Materials Unlike typical inorganic metals, semiconductors, and insulators, NLO materials feature more complex crystal

Measuring Crystal Quality Through XRD Reflection Analysis Assessing Crystal Quality via XRD Reflection Analysis Crystal quality cannot be directly measured, but several physical properties can be asse

Versatile Sample Handling: From Large Ingots to Tiny Crystals Diverse Geometries and Sizes of Crystalline Samples The industrial synthesis of single crystals begins with large, heavy boules and is pro

Quartz Blank Sorting Sorting of quartz blanks for AT, SC, TF & IT cut Precision Quartz Blank Evaluation for Optimal Oscillator Performance Quartz blanks are the core component of oscillator devices, e

Publications for Luminescence and ESR dating Material Research Cimmino, A., Olšovcová, V., Versaci, R., Horváth, D., Lefebvre, B., Tsinganis, A., Trunečková, Z. Radiation Protection at Petawatt Laser-

Omega-scan Ultra-Fast Orientation Measurement for Single Crystals Advantages of the Omega-Scan Method Stable and Simplified Setup The X-ray tube and detector remain fixed, requiring only a single meas

Minority carrier lifetime The minority carrier lifetime is one of the most important and significant material parameters. It i Minority carrier lifetime The minority carrier lifetime is one of the mos

Conductance Test and Power Loss The conductance test and power loss are used to determine the pass/fail criteria for the PID test In order to establish an easy way to decide whether a solar cell or mi

Photovoltaic Overcoming Industry Challenges with Cutting-Edge Metrology Solutions Advanced Measurement solutions for maximum yield and efficiency In the last years the overflow of global competitors a

Theta-scan Precision X-ray Method for Single Crystal Orientation Features of Theta-scan Pro allows to measure all crystalline materials, polytypes & orientations Contra at least 20 times slower than O

Radiation Monitoring System Cutting-Edge Technology for Accurate Radiation Detection and Measurement We are dedicated to delivering state-of-the-art radiation monitoring systems that cater to the vari

Diffusion length Diffusion length The diffusion length is the average distance that the excess carriers can cover before they recombine. Diffusion length depends on the lifetime and mobility of the ca

Quartz Bar Aligning Pre-alignment of bars | Preparation for sawing process Precision Alignment & Efficient Sawing of Quartz Bars Quartz bars serve as the raw material for cutting high-quality blanks w

Dependencies of PID Susceptibility PID susceptibility is influenced by factors such as temperature, voltage, encapsulation materials, and the solar cell’s SiNx layer Temperature Higher heating plate t

Static, transient or modulated light excitation pro and con The time-resolved or frequency-modulated, surface photovoltage spectroscopy (SPS) is based on a time-resolved/frequency modulated measuremen

SPV signal analysis: fits and simulations Charge dynamic simulations in photoactive materials, incl. heterojunction photoactive materials. We are currently developing simulation tools to enable first

Physical Nature of PID-s PID-s is a major threat to c-Si modules, with significant progress made in understanding its mechanisms In the field a large potential between the front glass surface and the

SPV-Picts SPV temperature dependence measurements Use this option to make SPV measurements at different temperatures between room temperature and 200°C. Temperature-dependent SPV measurements can be a

Comparison between MPD and SPV techniques MDP (microwave detected photoconductivity): sensitive to moving photogenerated charge carriers (bulk property) SPV (surface photovoltage): sensitive to surfac

Electrical and optical characterization using SPV/Kelvin Photocarrier generation and separation mechanisms Minority carrier lifetime measurement/Diffusion length calculations Trapped carrier dynamics,

Comparison of PID Test Methods A comparison with other widely used methods for PID testing demonstrates that the PIDcon has some unneglectable advantages The PIDcon test has the following advantages c

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygresearch Configuration options Spectrometry detection unit Spectrometry detection unit for I

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygresearch Configuration options Bleaching/Solar simulation unit Bleaching/Solar simulation un

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygresearch Configuration options Ultra-fast pulsing (< 10 ns) Ultra-fast pulsing (< 10 ns) Tim

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygresearch Optional accessories Sample cups/discs Sample cups/discs Excellent thermal conducti

Materials Any photoactive material from raw material to finished device: From powder-based samples over wafers to boules or ingots. From 10 x 10 mm 2 and up to 300 mm diameter From titanium dioxide ov

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygresearch Optional accessories Aliquot preparation kit Aliquot preparation kit for quick sili

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygresearch Optional accessories Vacuum pump Vacuum pump To automatically evacuate the measurem

Optional accessories for lexsyg research Sample cups/discs Learn more Aliquot preparation kit Learn more LED head lamp Learn more Vacuum pump Compact rotary vane pump, Automatically controlled by the

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygresearch Optional accessories Air compressor Air compressor Low noise and portable air compr

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Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygresearch Configuration options PMT detection unit PMT detection unit High-precision detectio

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygresearch Configuration options Pulsed OSL (10 µs) Pulsed OSL (10 µs) Maximum power, homogene

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Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygresearch Configuration options InfraRedPhotoLuminescence (IRPL) InfraRedPhotoLuminescence (I

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Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygresearch Configuration options Red stimulated quartz OSL Red stimulated quartz OSL allows a

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygresearch Configuration options Peltier cooling Peltier cooling for radiation defect characte

Configuration options for lexsyg research Automatic detector changer The detector changer is fully automatic and software controlled. It can hold and change up to four different detectors like standar

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygresearch Configuration options Irradiation sources Irradiation sources for irradiations from

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Optically stimulated Luminescence dating of quartz Exposure to light reduces the Optically stimulated Luminescence (OSL) signal from quartz and provides the basis for dating the event of light exposur

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry myOSLraser myOSLraser 4.0 4 Element Dosimeter 4 Element Dosimeter Compact and versatile – ensures

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LexStudio 2.0 - Operating software Taking luminescence to a new level User-friendly and advanced operating software Modern, professionally designed user interfacensitivity: Based on user feedback a ne

Photostimulated Luminescence (PSL) Used in wide range of dosimetric applications. Photostimulated Luminescence (PSL or POSL) is also called Optically Simulated Luminescence (OSL) and can be used for a

Infrared stimulated Luminescence dating Many types of sediment do not contain quartz and for dating the light exposure to light of such sediments Infrared stimulated Luminescence (IRSL) is used. Due t

Tooth enamel and quartz grains Archaeological sites often contain teeth from animals or humans or the site is contained in quartz bearing sediment. The enamel can be dated with Electron Spin Resonance

Unheated rock surfaces The last light exposure of rock surfaces can be dated for establishing the age of e.g. the construction and destruction of walls Granite or other quartz/feldspar containing rock

Sediment dating When sediments cover an archaeological site they are exposed to light and the mineral grains are bleached.Such events can be dated by luminescence methods and the age employed to deter

LexEva - Evaluation software Taking luminescence to a new level User-friendly and advanced operating software LexEva is a newly released evaluation software developed for analysis in luminescence rese

TLStudio - Operating & Evaluation software for routine TL dosimetry New graphical user interface with user friendly features and sequence editing options User account management system Transperent wor

OSLdosimetry OSLdosimetry is a user friendly operating software which allows OSL dose measurements as standard user or calibration and setting features for professionals (password protected). The OSLd

Flint and other heated rocks When rocks have been heated in antiquity the time of the last exposure to high temperatures can be determined Rocks containing amorphous/microcrystalline SiO 2 can be date

Ceramics, pottery, bricks and statues Optically Stimulated Luminescence (OSL) as well as Thermoluminescence (TL) can be applied to heated objects made from clay. While the typology of ceramics is a ba

Time resolved luminescence To investigate charge carrier dynamics, e.g. lifetimes Time resolved luminescence measurements allow the determination of the life-times of electron states and thus descript

Radiofluorescence A technique for dosimetric dating of potassium feldspar to establish sedimentation ages. Infrared-Radiofluorescence (IR-RF) is a technique for dosimetric dating of potassium feldspar

Spatially resolved luminescence Single grain dating for mixed sediments or heterogenous radiation fields Not every grain in a sediment sample reflects the same last bleaching and burial history. By an

Pulsing Pulsing the stimulation allows the separation of quartz and feldspar luminescence signals for dating of mixed mineral samples Sometimes mineral separation in sediment or solid samples is not p

Spatially resolved luminescence Spatial differentiation of luminescence signals for mineral specific analysis and hot spot identification Measuring luminescence with EMCCD camera allows for the spatia

Electron Spin Resonance Sedimentation ages can be established for quartz During long transport in fluvial systems the ESR (EPR) signal in quartz grains is sufficiently reduced to allow the determinati

Electron Spin Resonance A standard for many dosimetric application. Electron Spin Resonance (ESR/EPR) is an important tool for fundamental studies in many fields. Radicals are studied with ESR in life

Thermoluminescence Thermoluminescence dosimetry (TLD), radiation protection dosimetry Thermoluminescence (TL) is a backbone in radiation protection dosimetry with a long tradition and used for a wide

Food Irradiation Control using TL and PSL/OSL techniques European standards DIN EN 13751 | DIN EN 1788 Food stuff often is irradiated with ionizing radiation for sterilisation purposes. This requires

Configuration options for lexsyg smart Irradiation sources The lexsyg TL/OSL reader can be equipped with up to 2 irradiation units. A sensor controlled mechanical shutter moved by air pressure provide

Neutron dosimetry Accelerators, space dosimetry, high-LET Active dosimeters, like rem-mteters, superheated emulsions and electronic personal dosemeters can be used to measure neutron fields. But frequ

Medical dosimetry Radiotherapy, diagnostic radiology, nuclear medicine Medical dosimetry Ionizing radiation from a large variety of isotopic sources, as well as accelerators, electron beams, etc. are

Luminescence spectroscopy To investigate the luminescence properties of materials. Luminescence spectroscopy is used to investigate the luminescence properties of materials and thus allow more precise

Electron Spin Resonance Used in electron beam and neutron dosimetry and many kinds of photon radiation dosimetry. Electron Spin Resonance (ESR) The material alanine is considered as tissue equivalent

Optional accessories for lexsyg smart Additional sample carousel Each lexsyg smart TL/OSL reader is delivered with two exchangeable sample carousels with 50 samples positions (automatic changer) for ∅

Radioluminescence Online dosimetry, in vivo dosimetry Luminescence emitted during exposure to ionizing radiation can be employed for online dosimetry, e.g. in brachytherapy. Al 2 O 3 :C or BeO attache

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygsmart Configuration options Thermal stimulation (TL) Thermal stimulation Thermal stimulation

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Geology Optically stimulated Luminescence dating of quartz (OSL) Learn more Infrared stimulated Luminescence dating of feldspar (IRSL) Learn more Single grain/spatially resolved luminescence dating Le

Archaeology Flint and other heated rocks Learn more Ceramics, pottery, bricks and statues Learn more Unheated rock surfaces Learn more Tooth enamel and quartz grains Learn more Sediment dating Learn m

Privacy Policy 1. An overview of data protection General information The following information will provide you with an easy to navigate overview of what will happen with your personal data when you v

Epitaxial Layers & Thin Films Guaranteeing specifications in Semiconductor front-end processes Analyze wafer properties during wafering and front-end processes Near-surface wafer properties play a cru

p/n detection in bricks Changes in the conduction type of a multicrystalline brick are frequently observed, due to a high phosphorus concentration in the low quality feedstock. (Alttext kürzen, da zu

Automatic Wafer Sorting For microelectronics, and other microstructure technologies, crystalline wafers High-Precision Wafer Testing with Omega-Scan To ensure the exceptional performance required for

Crystal Surface Orientation Mapping Surface mapping is key to identifying issues in crystal growth and manufacturing Precise Surface Orientation Mapping with Omega-Scan Even within a single crystal, s

3D Mapping of Crystalline Turbine Blades for Production and Quality Control Precise Orientation Measurement for Turbine Blade Quality The high-temperature creep resistance of turbine blades made from

Radiation protection dosimetry TL, OSL, Radioluminescence, Electron Spin Resonance (ESR), Neutron dosimetry, Food irradiation and clinical dosimetry Precision in Radiation Protection and Dosimetry Fre

Lexsyg Applications Radiation protection dosimetry TL, OSL, Radioluminescence, Electron Spin Resonance (ESR), Neutron dosimetry, Food irradiation and clinical dosimetry Thermoluminescence (TL) Learn m

Lexsyg Software LexStudio 2.0 - Operating software Modern, professionally designed user interfacensitivity: Based on user feedback a new graphical user interface which combines clear arrangement and u

Luminescence Dating and Dosimetry TL/OSL series TL/OSL series lexsygsmart Learn more TL/OSL series lexsygresearch Learn more TL/OSL series Xray Dose Learn more TL/OSL series myOSLraser 2.0 Learn more

Solid state dosimetry Luminescence spectroscopy Learn more Spatially resolved luminescence Learn more Time resolved luminescence Learn more Electron Spin Resonance (ESR) Learn more

Research and Development Versatile Measurement solutions to empower and accelerate your R&D progress As a spin-off of the technical university in Freiberg, Freiberg Instruments has a strong scientific

Crystal Growth and Processing Solutions for Unrivaled Precision in Crystal Orientation Enhancing Accuracy in Grinding and Sawing: Optimize your Crystal Processing Freiberg Instruments sets new standar

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XRD surface mapping Unlock Material Insights with XRD Surface Mapping X-ray diffraction (XRD) surface mapping is a powerful analytical technique widely used in material science, physics, chemistry, an

Contact Where innovation takes shape Freiberg Instruments is headquartered in Freiberg, in Silicon Saxony. Here, our experts in R&D, metrology, electronics, mechatronics, engineering, sales, and admin

XRD for large crystals, ingots and boules Samples with a wide variety of geometry & size Learn more Marking and measuring of in-plane directions Learn more Crystal quality Learn more NLO Materials: Cr

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Quartz crystal processing Quartz Bar Aligning Learn more Quartz Blank Sorting Learn more

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About us At Freiberg Instruments, innovation drives everything we do Challenge accepted Empowering Progress, Delivering Precision Freiberg Instruments is committed to empowering market leaders and res

Customization Tailored Measurement Solutions for Unique Challenges Solutions Built for Your Needs At Freiberg Instruments, we understand that standard solutions may not always fit your specific requir

Automation Efficient Systems for Continuous Use Streamlining Your Workflow with Smart Automation We develop automation solutions that enhance efficiency, reliability, and scalability in industrial and

Luminescence Dating and Dosimetry Measuring Age and Radiation Exposure Cutting-Edge Technology for Accurate Age Determination and Dosimetry Freiberg Instruments specializes in advanced luminescence da

Research and Development Driving Innovation Together Advancing Measurement Technology Through Collaboration Research and development (R&D) is at the core of what we do at Freiberg Instruments. We part

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Publications for PID B. Durusoy, D. Adner, C. Hagendorf, K. Wojciechowski, S. Almosni, M. Turek. Standardized Test Routined for the Assessment of Potential Induced Degradation of Perovskite Solar Cell

Publications for MDP A.S. Kovali, M. Demant, B. Rebba, N. Schüler, J. Haunschild, S. Rein Early stage quality assessment in silicon ingots from MDP brick characterization Jan Beyer, Nadine Schüler, Jü

HR-SPS Technology Electrical and optical characterization using surface photovoltage spe Photocarrier generation and separation mechanisms, Minority carrier lifetime measurement/Diffusion length calcu

PID Technology Physical Nature of PID-s In the field a large potential between the front glass surface and the solar cells in a module can occur and a shunting of the p-n junction of a Si solar cell a

Publications for HS-SPS Dittrich, T. and Fengler, S. (2025). Surface Photovoltage Spectroscopy of Ultrawide Bandgap Materials. Phys. Status Solidi RRL 2400384. https://doi.org/10.1002/pssr.202400384 D

SPS/SPV Applications Silicon photovoltaic – Wafer check after diamond wire sawing Learn more Contactless detection of bulk polarization phenomena in semiconductors Learn more Electronic transitions in

MDP Software Software - PICTSStudio The PICTSStudio offers features for defect investigation like,Operation and configuration area, Results/charting, View of single transients and temperature dependen

Software PIDStudio PIDStudio is a cutting-edge, user-friendly software that is continuously updated and improved based on user feedback. It allows for easy handling and provides intuitive functionalit

PID Applications Production Monitoring Learn more EVA Evaluation Learn more Solar Cell Classification Learn more Mini-module Classification Learn more Glass Evaluation Learn more

HR-SPS Software Software - SPS Studio Learn more

MDP Technology Electrical Characterization The performance of semiconductor devices depends fundamentally on key electrical parameters of the material and therefore also on defect densities and their

Surface Photovoltage Spectroscopy Rapid, Contactless Analysis of Essential Electro-Optical Material Properties: The SPS/SPV series Surface Photovoltage Spectroscopy (SPS/SPV) is a proven technique for

Publications for XRD Gancarczyk, K., Albrecht, R., Berger, H., Szeliga, D., Gradzik, A., and Sieniawski, J. (2017). Determination of Crystal Orientation by Ω-Scan Method in Nickel-Based Single-Crystal

Microwave Detected Photoconductivity Versatile solutions, from OEM units to flexible research and production tools: The MDP series µPCD/MDP(QSS) Visualization of semiconductor quality is achieved by w

Potential Induced Degradation PID series Advanced Solutions for PID Detection and Quality Control in Solar Cells and Modules: The PID series The PID series leverage cutting-edge technology to ensure t

MDP Applications The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore suited for a wide variety of applications. Photoconductivit

Radiation Monitoring Systems RMS series RMS series SmartKONT Learn more RMS series Comet2500 Learn more RMS series SmartRAY2 Learn more RMS series Beta-Aerosol monitor Learn more RMS series GM 2100 Le

XRD Technology Omega-scan Ultra-Fast Orientation Measurement for Single Crystals Learn more Theta-scan Precision X-ray Method for Single Crystal Orientation Learn more

Solutions Innovative solutions for your Automation and Metrology challenges We provide cutting-edge metrology solutions designed to tackle the most complex challenges in automation and materials chara

Services Supporting Your Success At Freiberg Instruments, we are dedicated to helping you get the most out of your instruments. From tailored solutions to expert training and responsive technical supp

X-ray Diffraction Innovative Approaches to Crystal Orientation and Quality Assurance: The XRD series Freiberg Instruments specializes in manufacturing state-of-the-art X-ray diffractometers and automa

Company Innovation drives everything we do Driven by Innovation, Instruments Made to Measure We engineer and manufacture advanced measurement technologies and software solutions that redefine industry

XRD Applications Advanced X-Ray Solutions for Production and R&D Precision X-Ray Diffractometers for Industrial Crystal Analysis Freiberg Instruments designs and manufactures state-of-the-art X-ray di

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Microwave detected photoconductivity The advanced method MDP is suited for defect investigation and mapping of wafers and ingotsWith its extraordinary sensitivity, resolution and speed MDP enables inj

Comparison to µ-PCD and QSSPC Among carrier lifetime experiments, it is still one of the biggest problems to understand widely contradicting results as obtained by different experimental methods. With

Simulation of carrier profiles For measurements at thick samples like ingots, it is very important to simulate the carrier depth profile, that developes in the sample. The measured lifetime is strongl

MD-PICTS MD-PICTS is a modification of MDP, where temperature dependent measurements of the defect part of the transient are accomplished. MD-PICTS – microwave detected photo induced current transient

Penetration depth of different laser wavelength in silicon In silicon laser light with different wavelength has different penetration depth, hence the right laser should be used for different applicat

Materials Electrical properties and defects of a large variety of semiconductor materials, devices and dielectric materials can be investigated contact less and destruction free with our advanced meth

Products Innovative Metrology and Automation Solutions We engineer advanced metrology and automation solutions that redefine industry standards. Our precision-driven systems empower research and produ

PICTSStudio user friendly and advanced software for defect investigations The PICTSStudio offers features for defect investigation like, Operation and configuration area Results/charting View of singl

Highly spatial resolved inline metrology on Multicrystalline Silicon The minority carrier lifetime is a key parameter for the performance of solar cells. Therefore it is a suitable criterion for class

Determination of passivation homogeneity and surface recombination velocity For a lot of applications a well passivated surface is necessary e.g. in solar cells. With MDPmap and MDPingot it is possibl

Lifetime simulations To gain a better understanding of lifetime measurements and to achieve a better comparability between different measuring methods, it is necessary to perform simulations. Generali

Lifetime determination of epitaxial silicon thin-film layers In the PV as well as the microelectronic industry there are a lot of applications, were thin epitaxial layers are used. Because of that it

Resistivity measurement and mapping Resistivity mapping and measurement The electrical resistivity directly depends on the density of the semiconductor and is therefore a useful parameter to monitor d

Photoconductivity When light of sufficient energy is absorbed by a semiconductor, the number of free electrons and holes changes and raises the electrical conductivity of the semiconductor. Photocondu

Photoconductivity measurements of implanted samples Implantation of B and P are used for many applications in the microelectronic industry, but so far there was no method available to check the homoge

Mobility The mobility is a quantity related to the drift velocity of electrons or holes in an applied electric field across a material. The mobility depends on different scattering processes that can

Minority carrier lifetime measurements on SiC In recent years the quality of SiC materials has improved profoundly and hence SiC is becoming more and more a competitor to Si for e.g. high-power device

Microwave Detected Photo Induced Current Transient Spectroscopy (MD-PICTS) is a modification of MDP, where temperature dependent measurements of the defect part of the transient are accomplished. In o

Trap concentration determination Many lifetime measuring methods as QSSPC, µPCD or CDI, as well as MDP suffer from an anomalous high measured lifetime at very low injections. (Alttext kürzen, da zu la

Injection dependent measurements The minority carrier lifetime is strongly dependent on the injection (excess carrier concentration). From the shape and height of the lifetime curve information about

Detection of CrB in silicon The determination of the chromium concentration is very important, since chromium is one of the most abundant and also most detrimental defects in silicon. (Alttext kürzen,

Investigation of defect levels in InP InP is applied in high frequency technique, for lasers, communication technique and production of integrated circuits. Hence also for this material methods for de

Detection of BO2 in silicon Boron-oxygen complexes are one of the main reasons why solar cells degrade, when irradiated with sun light. Hence it is important to measure the boron-oxygen density in sil

Investigation of material quality of GaAs Besides silicon GaAs is one of the most important materials in modern technology and therefore a method to investigate the material quality is needed. (Alttex

Defect properties For the efficiency of solar cells the properties of a defect and its impact on the material quality are of great importance. Defect properties The properties of a defect and its impa

Inline metrology of mc-Si bricks Lifetime measurements are already widely used for material quality control especially in the photovoltaic industry. Taking it one step further, (Alttext zu lang) With

Contactless detection of bulk polarization phenomena in semiconductors Aim Characterization of bulk polarization phenomena such as the bulk photo-voltaic effect (BPVE) in semiconductors requires the p

Electronic transitions in diamond Aim For further development of optoelectronic devices and other applications based on diamond and nanodiamond, contactless characterization of electronic defect state

Resistance measurements on wafers and bricks The resistivity is one of the most important electrical parameters of a material. It is a key parameter for the performance of semiconductor devices as e.g

Light Beam Induced Current (LBIC) Light Beam Induced Current (LBIC) is a primarily in the photovoltaic sector well established method for the spatial resolved measurement of recombination active defec

Characterization of Ga2O3 Aim Ga 2 O 3 is an ultra-wide band gap semiconductor with a great application potential. The contactless characterization of defect related transitions with high sensitivity

Photoconductivity measurements and trap analysis of wide bandgap nitride semiconductors Equipped with a 355 nm laser (μ-PCD) or a 375 nm laser diode (MDP), the MDPmap as well as the MDpicts from Freib

Iron concentration determination The exact determination of the iron concentration is very important, since iron is one of the most abundant and also most detrimental defects in silicon. (Alttext kürz

Minority carrier Lifetime maps on 450 mm wafers Since several years, the microelectronic industry is planning to enlarge the wafer size from 300 mm (12 inch) to 450 mm (18 inch) diameter, in order to

Software - SPS Studio Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstrumen

Silicon photovoltaic – Wafer check after diamond wire sawing Diamond wire sawing (DWS) is an established technology for wafering semiconductor ingots, as it has many advantages over other technologies

Study and monitoring of photocatalytic materials (TiO2) Aim Photocatalytic materials such as TiO 2 are of great interest, for example, for cleaning of industrial wastewater and for water splitting. Th

Dr. Nadine Schüler Communicator and mastermind We always try to keep our finger on the pulse. It motivates me immensely to be part of a company that makes a significant contribution to overcoming chal

Marcus Göhler Head of Electronics Development I want to translate the innovative strength of Freiberg Instruments into smart products. Dipl. Ing. Marcus Göhler Head of Electronics Development He has b

Thanga Kumar Sales Director I like the spirit of Freiberg Instruments: innovative, team-oriented, dynamic. Thanga Kumar Sales Director He develops and implements sales strategies, maintains customer r

Investigation of photocatalytic materials (BiVO4) Aim Photocatalytic materials such as BiVO 4 are of great interest, for example, for water splitting. Electronic defect states and surface passivation

Dr. Viktoriia Nikonova Product Manager - Surface Photovoltage Spectroscopy My role at Freiberg Instruments: Improve, refine, optimize. Dr. Viktoriia Nikonova Product Manager SPV/SPS Viktoriia has been

Contactless characterization of SiC, GaN and AlGaN Aim SiC, GaN and AlGaN belong to the class of wide band gap semiconductors and are applied especially in power electronics, optoelectronic devices an

Defects and charge dynamics in 3C- and 4H-SiC investigated by surface Photoelectrochemical (PEC) and photocatalytic (PC) water splitting for hydrogen and/or oxygen generation is leading the way not on

Dr. Christian Hagendorf Project & Key Account Manager The market launch of RESmap was a special milestone – a game changer for the semiconductor industry. Prof. Dr. Christian Hagendorf Project & Key A

Burkhard Winkler Idea generator and Senior Sales Engineer for semiconductors and automation I came up with the idea for Ingot XRD Wire Saw, which immediately convinced our customers. Burkhard Winkler

Marcus Richter Application & Service Engineer in the XRD area We solve measurement problems that others struggle with. Marcus Richter Application & Service Engineer Marcus has been supporting the #app

Diana Trinks Organizer, decision-maker and fire extinguisher Always striving forward, rethinking and developing something new from what we have learned. Diana Trinks Executive Assistant Diana has been

Martin Ferkinghoff Head of Service Freiberg Instruments is the right place for you if you enjoy achieving milestones as part of a team, remain curious and have a desire for change. Martin Ferkinghoff

Solar Cell Classification The PIDcon enables quick, routine quality control of solar cell PID susceptibility, unaffected by the EVA foil and glass Potential Induced Degradation (PID) poses a significa

Glass Evaluation Glass resistivity is key to PID susceptibility and must be tested independently from the solar cell and EVA Since the PV community recognized the PID issue, extensive research has sho

Mini-module Classification The PIDcon benchtop system offers fast, cost-effective routine quality control for mini-modules' PID susceptibility, without the need for a climate chamber Potential Induced

EVA Evaluation PIDcon allows producers to test both solar cells and encapsulation materials, with a focus on EVA foil’s impact on PID susceptibility The PIDcon allows for the investigation of how EVA

Production Monitoring according to IEC 62804 standard Potential Induced Degradation (PID) is a significant reliability issue in photovoltaic (PV) power plants. It is crucial to assess the susceptibili

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XRDStudio Cutting-Edge Software for Controlling X-ray Diffractometers User-Friendly and Advanced Operating Software Multiple Operating Modes Operator Mode : Designed for fixed measurement parameters,

PIDStudio User friendly and advanced operating software PIDStudio is a cutting-edge, user-friendly software that is continuously updated and improved based on user feedback. It allows for easy handlin