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Projects

R&D Projects Achieving goals together: Projects with measurable added value Freiberg Instruments stands for the highest precision and groundbreaking technologies in materials research and measurement

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Software

Lexsyg Software LexStudio 2.0 - Operating software Modern, professionally designed user interfacensitivity: Based on user feedback a new graphical user interface which combines clear arrangement and u

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Applications

Lexsyg Applications Radiation protection dosimetry TL, OSL, Radioluminescence, Electron Spin Resonance (ESR), Neutron dosimetry, Food irradiation and clinical dosimetry Thermoluminescence (TL) Learn m

Technology

PIDStudio

PIDStudio User friendly and advanced operating software PIDStudio is a cutting-edge, user-friendly software that is continuously updated and improved based on user feedback. It allows for easy handlin

Product

PIDcon bifacial

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Potential Induced Degradation PIDcon bifacial PID con bifacial Quality Control Solution for Bifacial PERC/PERC+, HIT, Topcon, c-Si S

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Publications

Publications for PID B. Durusoy, D. Adner, C. Hagendorf, K. Wojciechowski, S. Almosni, M. Turek. Standardized Test Routined for the Assessment of Potential Induced Degradation of Perovskite Solar Cell

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Technology

PID Technology Physical Nature of PID-s In the field a large potential between the front glass surface and the solar cells in a module can occur and a shunting of the p-n junction of a Si solar cell a

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Applications

PID Applications Production Monitoring Learn more EVA Evaluation Learn more Solar Cell Classification Learn more Mini-module Classification Learn more Glass Evaluation Learn more

Application

Contactless detection of bulk polarization phenomena in semiconductors

Contactless detection of bulk polarization phenomena in semiconductors Aim Characterization of bulk polarization phenomena such as the bulk photo-voltaic effect (BPVE) in semiconductors requires the p

Application

Electronic transitions in diamond

Electronic transitions in diamond Aim For further development of optoelectronic devices and other applications based on diamond and nanodiamond, contactless characterization of electronic defect state