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Light Beam Induced Current (LBIC) Light Beam Induced Current (LBIC) is a primarily in the photovoltaic sector well established method for the spatial resolved measurement of recombination active defec

Resistance measurements on wafers and bricks The resistivity is one of the most important electrical parameters of a material. It is a key parameter for the performance of semiconductor devices as e.g

Photoconductivity measurements and trap analysis of wide bandgap nitride semiconductors Equipped with a 355 nm laser (μ-PCD) or a 375 nm laser diode (MDP), the MDPmap as well as the MDpicts from Freib

Publications for MDP A.S. Kovali, M. Demant, B. Rebba, N. Schüler, J. Haunschild, S. Rein Early stage quality assessment in silicon ingots from MDP brick characterization Jan Beyer, Nadine Schüler, Jü

MDP Software Software - PICTSStudio The PICTSStudio offers features for defect investigation like,Operation and configuration area, Results/charting, View of single transients and temperature dependen

MDP Technology Electrical Characterization The performance of semiconductor devices depends fundamentally on key electrical parameters of the material and therefore also on defect densities and their

MDP Applications The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore suited for a wide variety of applications. Photoconductivit