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Surface Photovoltage Spectroscopy Rapid, Contactless Analysis of Essential Electro-Optical Material Properties: The SPS/SPV series Surface Photovoltage Spectroscopy (SPS/SPV) is a proven technique for analyzing bulk, interface, and surface-related properties in electro-optical materials. Traditionally limited to specialized labs, commercial SPV solutions remain scarce, often restricted to niche applications. Freiberg Instruments’ HR-SPS platform redefines material characterization with high-resolution, contactless analysis for virtually any electro-optical material – from powder-based samples, nanoparticle structures to 300 mm silicon wafers. Designed for both production and research, it enables rapid, precise assessments for manufacturing and material innovation. With applications spanning defect characterization in semiconductors (silicon, silicon carbide, and wide-bandgap semiconductors like gallium oxide and diamond), charge dynamics analysis in photocatalysts (copper oxide and titanium oxide), and beyond, HR-SPS brings unparalleled versatility and efficiency to SPV analysis. SPS/SPV series HR-SPSmap with fixed energy excitation sources Learn more SPS/SPV series HR-SPSmap with variable energy excitation source Learn more Discover more of the SPS/SPV series Applications Learn more Technology Learn more Software Learn more Publications Learn more With HR-SPSmap, you can achieve precise and quick insights of your semiconductor and photoactive materials with advanced and contactless technology. Dr. Nadine Schüler Head of Research & Development Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Microwave Detected Photoconductivity Unlock material insights with µPCD/MDP(QSS) – High-resolution, contactless measurement solutions for research and production: The MDP series Visualization of semiconductor quality is achieved by widely advanced microwave techniques. Which allow for a mapping of key electrical semiconductor parameters contactless and with production speed. Measurement of parameters like minority carrier lifetime, photoconductivity, resistivity and defect information can be mapped by a so far unsurpassed combination of spatial resolution, sensitivity and measurement speed. From OEM modules to turnkey systems, the MDP series adapts to your workflow – empowering your next innovation in microelectronics and photovoltaics. MDP series MDPmap Learn more MDP series MDPspot Learn more MDP series MDpicts pro Learn more MDP series MDPpro 850+ Learn more MDP series MDPlinescan Learn more MDP series MDpicts Learn more MDP series MDPpro Learn more MDP series HTpicts Learn more Discover more of the MDP series Applications Learn more Technology Learn more Software Learn more Publications Learn more Seamlessly transition from lab research to full-scale production with our advanced “Lab to Fab” electrical characterization equipment. Dr. Nadine Schüler Head of Research & Development Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Publications for XRD Gancarczyk, K., Albrecht, R., Berger, H., Szeliga, D., Gradzik, A., and Sieniawski, J. (2017). Determination of Crystal Orientation by Ω-Scan Method in Nickel-Based Single-Crystal Turbine Blades. W. Bogdanwicz, R. Albrecht, J. Sieniawski, K. Kubiak: The subgrain structure in turbine blade roots of CMSX-4 superalloy. B. Nestler, H.-J. Kuhr, G. Hildebrandt, H. Bradaczek: Novel use of a commercial goniometer for sorting round quartz blanks. Meas. Sci. Technol. 2 (1991), 528-531. G. Hildebrandt, H. Bradaczek: Experiences with Quartz Oscillator Angle-Sorting. Cryst. Res. Technol. 37 (2002), 111-118. H. Berger: Simulation of X-Ray Reflection Curves in Single Non-Coplanar Geometry and Its Application. Cryst. Res. Technol. 37 (2002), 716-726. H. Berger: X-ray orientation determination of single crystals by means of the Ω-Scan Method. J. Phys. IV France 118 (2004), 37-4. H. Berger, H.-A. Bradaczek, H. Bradaczek, “Omega-Scan: an X-ray tool for the characterization of crystal properties”, J. Mater. Sci.: Mater. Electron. 19 (2008) S351-S355 A. Onyszko, J. Sieniawski, W. Bogdanowicz , H. Berger: Two methods of studying structure perfection of single crystal nickel-based superalloy. Solid State Phenomena, 203-204 (2013), 177-180.

Potential Induced Degradation PID series Advanced Solutions for PID Detection and Quality Control in Solar Cells and Modules: The PID series The PID series leverage cutting-edge technology to ensure the highest standards of quality control for solar cells and modules . The devices are designed to address Potential Induced Degradation (PID) in photovoltaic systems, offering essential tools for assessing the performance and longevity of solar panels . PID series PIDcon bifacial Learn more Discover more of the PID series Applications Learn more Technology Learn more Publications Learn more With our PIDcon bifacial testing device, module manufacturers can perform reliable quick tests of solar cells and encapsulation materials during production. Dr. Christian Hagendorf Key Account Manager Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

XRD Applications Advanced X-Ray Solutions for Production and R&D Precision X-Ray Diffractometers for Industrial Crystal Analysis Freiberg Instruments designs and manufactures state-of-the-art X-ray diffractometers tailored for macroscopic single crystals used in industrial crystal growth and production. Our advanced solutions support diverse applications in microelectronics, optics, and electromechanics. We offer cutting-edge methods for precise orientation determination and comprehensive surface quality assessment, ensuring the highest standards in crystal evaluation. Read more Crystal Surface Orientation Mapping Learn more Automatic Wafer Sorting Learn more 3D Mapping of Crystalline Turbine Blades Learn more Quartz Crystal processing Quartz Bar Aligning Learn more Quartz Blank Sorting Learn more XRD for large crystals, ingots and boules Samples with a wide variety of geometry & size Learn more Marking and measuring of in-plane directions Learn more Crystal quality Learn more NLO Materials: Crystal Quality & Optical Axis Orientation Learn more

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products X-ray Diffraction Omega/Theta XRD Automatic X-Y mapping stage Automatic X-Y mapping stage for wafers and ingots Interested? Get in touch! Contact now The mapping stage allows to explore the whole sample surface using a controlled grid pattern. An Omega/Theta XRD can easily accommodate the additional xy-positioning stage on top of the turntable. The sample surface can be scanned according to a user-defined grid. The minimum grid spacing is about 1 mm, due to the size of the X-ray spot on the sample. The mapping stage can be combined with Omega Scan to get a crystal orientation mapping or with the rocking curve measurement to get a mapping of distortions on the surface. Software packages for display and analysis are available. YouTube Here you can find external content of the provider Google LLC. To be able to display these, we need your consent. privacy policy Show provider content Automatic X-Y mapping stage

Radiation Monitoring Systems RMS series RMS series SmartKONT Learn more RMS series Comet2500 Learn more RMS series SmartRAY2 Learn more RMS series Beta-Aerosol monitor Learn more RMS series GM 2100 Learn more Discover more of the RMS series Services Learn more Quality and Certification Learn more About us Learn more Our solutions provide real-time monitoring, ensuring compliance and protection in critical industrial and research environments. Dipl.-Ing. Andreas Richter Quality Management Officer Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

XRD Technology Omega-scan Ultra-Fast Orientation Measurement for Single Crystals Learn more Theta-scan Precision X-ray Method for Single Crystal Orientation Learn more

Solutions Innovative solutions for your Automation and Metrology challenges We provide cutting-edge metrology solutions designed to tackle the most complex challenges in automation and materials characterization. Our state-of-the-art systems ensure precision, efficiency, and reliability across multiple high-tech industries. Crystal Growth and Processing Achieve unrivaled accuracy in crystal orientation and processing. Our advanced X-ray diffraction (XRD) systems optimize grinding and sawing processes, ensuring perfect alignment for high-performance semiconductor applications. Discover Epitaxial Layers & Thin Films Guarantee the highest standards in semiconductor front-end processes with precise thin-film characterization. Our non-destructive metrology tools provide critical insights into wafer properties, layer thickness, and defect detection. Discover Photovoltaic Maximize solar cell efficiency with our industry-leading metrology solutions. Our advanced tools support high-speed, high-accuracy analysis of wafers and thin films, ensuring optimal yield and production performance. Discover Luminescence Dating and Dosimetry Empowering researchers with high-precision luminescence dating tools for age determination and radiation exposure assessments. Our instruments provide unparalleled sensitivity and reliability in geochronology and dosimetry applications. Discover Radiation Monitoring Enhance workplace and environmental safety with cutting-edge radiation detection systems. Our solutions provide real-time monitoring, ensuring compliance and protection in critical industrial and research environments. Discover Research and Development Accelerate innovation with flexible, high-precision measurement solutions tailored for R&D applications. Our advanced metrology tools support material research, semiconductor development, and defect analysis with maximum accuracy. Discover R&D Projects We turn visionary ideas into measurable success. Our R&D projects showcase cutting-edge technologies and pioneering collaborations—whether in partnership with leading research institutions or within high-tech industries. Discover Our advanced metrology solutions enable industries to enhance efficiency, investigate defects & drive innovation—ensuring excellence in semiconductor manufacturing, photovoltaics & materials research. Ing. Thanga Kumar Sales Director Can't find the solution you're looking for? Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our enquiry tool or reach out via email: sales@freiberginstruments.com Discover more Products Learn more Services Learn more Company Learn more

Services Supporting Your Success At Freiberg Instruments, we are dedicated to helping you get the most out of your instruments. From tailored solutions to expert training and responsive technical support, our services are designed to keep your operations running smoothly and efficiently. Explore how we can support you in achieving reliable results and long-term success. Customization Solutions Built for Your Needs We modify standard devices or develop new ones to fit your specific requirements. Whether it’s adapting a system to your workflow or creating a custom solution for a unique application, we ensure your instruments are optimized for your processes. Learn more about Customization Automation Efficient Systems for Continuous Use Our automation solutions are designed for high-volume production and reliable operation. With seamless integration into production lines, they ensure consistent quality and efficiency, helping you scale your processes with confidence. Discover Automation Research and Development Driving Innovation Together Partner with us to develop new technologies and methods for advanced applications. Whether it’s creating prototypes, exploring new materials, or solving complex challenges, our R&D services help turn your ideas into reality. Explore Research & Development Training and Application Expertise Get the Most Out of Your Instruments We provide practical, easy-to-follow training tailored to your needs. Whether you’re an individual or a team, our sessions cover everything from instrument use to advanced analysis, giving you the skills to achieve better results. Enhance Your Knowledge Technical Support Here When You Need Us Our expert team is ready to assist you with any technical issues – big or small. With remote support, fast repairs, and local-language assistance, we minimize downtime and keep your systems running smoothly. Get Technical Support We boost your instruments' performance with proactive maintenance, expert support, and flexible solutions – saving time, cutting costs, and delivering reliable results. Your success matters to us. Martin Ferkinghoff Head of Service Can't find the service you're looking for? Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our enquiry tool or reach out via email: sales @ freiberginstruments.com Discover more Products Learn more Solutions Learn more Company Learn more