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Surface Photovoltage Spectroscopy Rapid, Contactless Analysis of Essential Electro-Optical Material Properties: The SPS/SPV series Surface Photovoltage Spectroscopy (SPS/SPV) is a proven technique for

Microwave Detected Photoconductivity Unlock material insights with µPCD/MDP(QSS) – High-resolution, contactless measurement solutions for research and production: The MDP series Visualization of semic

Publications for XRD Gancarczyk, K., Albrecht, R., Berger, H., Szeliga, D., Gradzik, A., and Sieniawski, J. (2017). Determination of Crystal Orientation by Ω-Scan Method in Nickel-Based Single-Crystal

Potential Induced Degradation PID series Advanced Solutions for PID Detection and Quality Control in Solar Cells and Modules: The PID series The PID series leverage cutting-edge technology to ensure t

XRD Applications Advanced X-Ray Solutions for Production and R&D Precision X-Ray Diffractometers for Industrial Crystal Analysis Freiberg Instruments designs and manufactures state-of-the-art X-ray di

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products X-ray Diffraction Omega/Theta XRD Automatic X-Y mapping stage Automatic X-Y mapping stage for wafers and ingots Interested? Get in t

Radiation Monitoring Systems RMS series RMS series SmartKONT Learn more RMS series Comet2500 Learn more RMS series SmartRAY2 Learn more RMS series Beta-Aerosol monitor Learn more RMS series GM 2100 Le

XRD Technology Omega-scan Ultra-Fast Orientation Measurement for Single Crystals Learn more Theta-scan Precision X-ray Method for Single Crystal Orientation Learn more

Solutions Innovative solutions for your Automation and Metrology challenges We provide cutting-edge metrology solutions designed to tackle the most complex challenges in automation and materials chara

Services Supporting Your Success At Freiberg Instruments, we are dedicated to helping you get the most out of your instruments. From tailored solutions to expert training and responsive technical supp