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Penetration depth of different laser wavelength in silicon In silicon laser light with different wavelength has different penetration depth, hence the right laser should be used for different applicat

Materials Electrical properties and defects of a large variety of semiconductor materials, devices and dielectric materials can be investigated contact less and destruction free with our advanced meth

Mobility The mobility is a quantity related to the drift velocity of electrons or holes in an applied electric field across a material. The mobility depends on different scattering processes that can

Defect properties For the efficiency of solar cells the properties of a defect and its impact on the material quality are of great importance. Defect properties The properties of a defect and its impa

PICTSStudio user friendly and advanced software for defect investigations The PICTSStudio offers features for defect investigation like, Operation and configuration area Results/charting View of singl

Highly spatial resolved inline metrology on Multicrystalline Silicon The minority carrier lifetime is a key parameter for the performance of solar cells. Therefore it is a suitable criterion for class

Determination of passivation homogeneity and surface recombination velocity For a lot of applications a well passivated surface is necessary e.g. in solar cells. With MDPmap and MDPingot it is possibl

Lifetime determination of epitaxial silicon thin-film layers In the PV as well as the microelectronic industry there are a lot of applications, were thin epitaxial layers are used. Because of that it

Resistivity measurement and mapping Resistivity mapping and measurement The electrical resistivity directly depends on the density of the semiconductor and is therefore a useful parameter to monitor d

Injection dependent measurements The minority carrier lifetime is strongly dependent on the injection (excess carrier concentration). From the shape and height of the lifetime curve information about