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Application

Photoconductivity measurements and trap analysis

Photoconductivity measurements and trap analysis of wide bandgap nitride semiconductors Equipped with a 355 nm laser (μ-PCD) or a 375 nm laser diode (MDP), the MDPmap as well as the MDpicts from Freib

Technology

Software - SPS Studio

Software - SPS Studio Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstrumen

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Burkhard Winkler

Burkhard Winkler Idea generator and Senior Sales Engineer for semiconductors and automation I came up with the idea for Ingot XRD Wire Saw, which immediately convinced our customers. Burkhard Winkler

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Marcus Richter

Marcus Richter Application & Service Engineer in the XRD area We solve measurement problems that others struggle with. Marcus Richter Application & Service Engineer Marcus has been supporting the #app

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Dr. Nadine Schüler

Dr. Nadine Schüler Communicator and mastermind We always try to keep our finger on the pulse. It motivates me immensely to be part of a company that makes a significant contribution to overcoming chal

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Diana Trinks

Diana Trinks Organizer, decision-maker and fire extinguisher Always striving forward, rethinking and developing something new from what we have learned. Diana Trinks Executive Assistant Diana has been

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Marcus Göhler

Marcus Göhler Head of Electronics Development I want to translate the innovative strength of Freiberg Instruments into smart products. Dipl. Ing. Marcus Göhler Head of Electronics Development He has b

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Thanga Kumar

Thanga Kumar Sales Director I like the spirit of Freiberg Instruments: innovative, team-oriented, dynamic. Thanga Kumar Sales Director He develops and implements sales strategies, maintains customer r

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Dr. Viktoriia Nikonova

Dr. Viktoriia Nikonova Product Manager - Surface Photovoltage Spectroscopy My role at Freiberg Instruments: Improve, refine, optimize. Dr. Viktoriia Nikonova Product Manager SPV/SPS Viktoriia has been

Application

Contactless characterization of SiC, GaN and AlGaN

Contactless characterization of SiC, GaN and AlGaN Aim SiC, GaN and AlGaN belong to the class of wide band gap semiconductors and are applied especially in power electronics, optoelectronic devices an