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MDpicts

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Microwave Detected Photoconductivity MDpicts MDpicts Temperature-Dependent Lifetime Measurement System for Advanced Material Analysi
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MDPpro 850+

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Microwave Detected Photoconductivity MDPpro 850+ MDPpro 850+ Advanced Solution for Quality Control of Monocrystalline Silicon Ingots
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MDPspot

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Microwave Detected Photoconductivity MDPspot MDPspot Quick and Simple Lifetime Measurement Made Easy Interested? Get in touch! Conta
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MDPpro

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Microwave Detected Photoconductivity MDPpro MDPpro Advanced Lifetime Measurement System for Quality Control and Material R&D on Semi
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MDPlinescan

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Microwave Detected Photoconductivity MDPlinescan MDPlinescan Versatile OEM Unit for Lifetime Measurements on Silicon Samples, from B
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MDpicts pro

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Microwave Detected Photoconductivity MDpicts pro MDpicts pro High-Resolution, Temperature-Dependent Lifetime Measurement System for

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HTpicts

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Microwave Detected Photoconductivity HTpicts HTpicts Advanced High-Temperature Lifetime Measurement System for In-Depth Material Ana
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GM 2100

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Radiation Monitoring Systems GM 2100 GM 2100 Gamma Radiation Monitor Interested? Get in touch! Contact now Skip menu Quick navigatio
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Publications

Publications for Luminescence and ESR dating Material Research Cimmino, A., Olšovcová, V., Versaci, R., Horváth, D., Lefebvre, B., Tsinganis, A., Trunečková, Z. Radiation Protection at Petawatt Laser-
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Defects in 4H-SiC

Defects in 4H-SiC Investigated by surface photovoltage spectroscopy Defects in 4H-SiC investigated by surface photovoltage spectroscopy – power semiconductors Silicon carbide (SiC) high power, high vo