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Spatially resolved luminescence Single grain dating for mixed sediments or heterogenous radiation fields Not every grain in a sediment sample reflects the same last bleaching and burial history. By an

Simulation of carrier profiles For measurements at thick samples like ingots, it is very important to simulate the carrier depth profile, that developes in the sample. The measured lifetime is strongl

Silicon photovoltaic – Wafer check after diamond wire sawing Diamond wire sawing (DWS) is an established technology for wafering semiconductor ingots, as it has many advantages over other technologies

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Sediment dating When sediments cover an archaeological site they are exposed to light and the mineral grains are bleached.Such events can be dated by luminescence methods and the age employed to deter

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Versatile Sample Handling: From Large Ingots to Tiny Crystals Diverse Geometries and Sizes of Crystalline Samples The industrial synthesis of single crystals begins with large, heavy boules and is pro

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygresearch Optional accessories Sample cups/discs Sample cups/discs Excellent thermal conducti

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygsmart Optional accessories Sample cups/discs Sample cups/discs Excellent thermal conductivit

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygresearch Configuration options Sample camera Sample camera The sample camera is designed to