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Mobility The mobility is a quantity related to the drift velocity of electrons or holes in an applied electric field across a material. The mobility depends on different scattering processes that can

Diffusion length Diffusion length The diffusion length is the average distance that the excess carriers can cover before they recombine. Diffusion length depends on the lifetime and mobility of the ca

Defect properties For the efficiency of solar cells the properties of a defect and its impact on the material quality are of great importance. Defect properties The properties of a defect and its impa

Lifetime simulations To gain a better understanding of lifetime measurements and to achieve a better comparability between different measuring methods, it is necessary to perform simulations. Generali

Simulation of carrier profiles For measurements at thick samples like ingots, it is very important to simulate the carrier depth profile, that developes in the sample. The measured lifetime is strongl

Microwave detected photoconductivity The advanced method MDP is suited for defect investigation and mapping of wafers and ingotsWith its extraordinary sensitivity, resolution and speed MDP enables inj

Comparison to µ-PCD and QSSPC Among carrier lifetime experiments, it is still one of the biggest problems to understand widely contradicting results as obtained by different experimental methods. With

MD-PICTS MD-PICTS is a modification of MDP, where temperature dependent measurements of the defect part of the transient are accomplished. MD-PICTS – microwave detected photo induced current transient

Penetration depth of different laser wavelength in silicon In silicon laser light with different wavelength has different penetration depth, hence the right laser should be used for different applicat

Materials Electrical properties and defects of a large variety of semiconductor materials, devices and dielectric materials can be investigated contact less and destruction free with our advanced meth