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LED head lamp

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygsmart Optional accessories LED head lamp LED head lamp Red head lamp for sample treatment in dark rooms or luminescence labs Interested? Get in touch! Contact now 660 nm ± 15 nm Two intensities No side bands

Technology

LexEva - Evaluation software

LexEva - Evaluation software Taking luminescence to a new level User-friendly and advanced operating software LexEva is a newly released evaluation software developed for analysis in luminescence research and dating. LexEva was adapted to the "Luminescence" package developed by the R. Luminescence Group (RLG) , an user interface. The main idea is to provide easy access to the powerful "Luminescence" package containing algorithms and plots, which were developed by and for the community. One can perform a simple SAR calculation or transform CW OSL curves into LM luminescence curves via. various interpolations. TL analysis with plateau evaluation, including additive and regeneration regression analysis of multiple aliquots. You can test some of the new analysis like IRSAR RF or implement your own calculations and become a part of the development. Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Technology

LexStudio 2.0 - Operating software

LexStudio 2.0 - Operating software Taking luminescence to a new level User-friendly and advanced operating software Modern, professionally designed user interfacensitivity: Based on user feedback a new graphical user interface which combines clear arrangement and usability is developed by Freiberg Instruments Game-changing data format: The newly developed data format connects the benefits of XML with the requirements of luminescence application and science, providing transparency, readability and flexibility New sequence editor: The new sequence editor provides almost unlimited variability creating entire individual as well as standard measurement sequences User account management system : Several user access levels assure the lexsyg device is only operated by qualified personnel Automated sample recognition in the sample wheel: A sensor-based sample recognition system provides the status of each position of the sample wheel at any time Filter management system: The LexStudio 2.0 software contains a filter management system providing convenient implementation and testing of new detection filter combinations Loading the sample wheel : The new sensor-based monitoring of the sample charging allows the loading of the sample wheel with new aliquots as well as allocating new measurement sequences while the lexsyg device is taking measurements Reduced measurement time by time-optimized device operations: Simultaneous execution of independent sequence steps (e.g. filterwheel movement, sample transport, changing of measurement position, etc.) reduces the required time for each measurement sequence SAR Plug-In SAR Plug-In (SARPI) is a new software feature added to LexStudio 2.0 for quick and convenient SAR sequence creation. No more copy and paste. It can be easily expanded to other protocols and it is compatible with all lexsyg devices. User action Select 4 individual parameters Estimated and test dose Stimulation wavelength and filter combination All other parameters are user defined presets Automated software functionality Sequence creation based on SAR protocol Recuperation test Recycling test Hot bleach Individual adjustment by sequence editor is possible as well SAR Plug-in Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Application

Lifetime determination of epitaxial silicon thin-film layers

Lifetime determination of epitaxial silicon thin-film layers In the PV as well as the microelectronic industry there are a lot of applications, were thin epitaxial layers are used. Because of that it is necessary to control the quality of the epitaxial layers with contact less and (Alttext zu lang) With MDP it is possible to measure the lifetime of minority carriers and the photoconductivity in epitaxial layers as fast and exactly as possible with a high resolution. The measurement of epitaxial layers and the determination of their quality is a huge challenge for lifetime measuring methods, since the signal intensity is very small and the results are very difficult to interpret due to the many recombination sites (fig. 1). In the MDPmap and MDPingot equipment it is possible to integrate up to 4 lasers with different wavelength and hence different penetration depth. Furthermore it is possible to measure with different pulse length from a very short pulse of only 100 ns, where no carrier diffusion takes place to a pulse length of several ms, where the carriers diffuse into the sample depth. Hence by varying the laser wavelength and the pulse length, it is possible to measure with different penetration depth and deduce from the lifetime results, which recombination site is the most dominant one. Figure 2 shows an example where a sample series with different substrate qualities and epitaxial layer thicknesses were measured, demonstrating the dependence of the measured lifetime from the substrate, interface quality and surface quality. For more information about the determination of lifetime of epitaxial layers read: [1] D. Walter, P. Rosenits, F. Kopp, B. Berger, K. Dornich, W. Warta: “Determining the epitaxial carrier lifetime by microwave-detected photoconductance measurements”, Proc. Of the 25th EU PVSEC , submitted (2010) [2] K. Dornich, T. Hahn, J.R. Niklas: “Non-destructive electrical characterization and topography of silicon wafers and epitaxial layers”, Mater. Res. Soc. Symp. Proc. Vol. 864 , 549-554 (2005) Fig. 1: recombination site, which contribute to the measured lifetime Fig. 2: measured lifetime of samples with different substrate qualities and epitaxial layer thicknesses Related Solutions and Industries: Epitaxial Layers & Thin Films Matching Products MDP series MDPpro 850+ Advanced Solution for Quality Control of Monocrystalline Silicon Ingots, Bricks, and Wafers Learn more MDP series MDPmap Precision Lifetime Charachterization with Exceptional Sensitivity Learn more MDP series MDPpro Advanced Lifetime Measurement System for Quality Control and Material R&D on Semiconductors Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Technology

Lifetime simulations

Lifetime simulations To gain a better understanding of lifetime measurements and to achieve a better comparability between different measuring methods, it is necessary to perform simulations. Generalized rate equations for lifetime simulations This numerical tool is based on a generalized rate equation system, which is solved for all possible transitions between the defect levels in the forbidden gap and the bands of a semiconductor. The only approximation is, that no interactions between defect levels are included. This is a valid approximation, since the defect density in silicon is typically low. The applied rate equation system describes the time dependent change of carrier concentrations in the conduction and valence band, as well as in defect levels. In this equation system the optical and thermal generation rates, the band to band and Auger recombination rates and the carrier capture and emission rates from all defects (Cj, Dj, Ej, Fj) are included. The transition rates are described without any approximations. \(\dot{n} = G^0_{BB} + G^th_{BB} + \sum_{j}(C_j - D_j) - R_{BB} - R_{Aug}\) \(\dot{p} = G^0_{BB} + G^th_{BB} + \sum_{j}(F_j - E_j) - R_{BB} - R_{Aug}\) \(\dot{n}_{Tj} = D_j + E_j) - C_j - F_j\) Fig. 1: energy scheme of all transition rates that are included into the simulations From the simulated time dependent carrier concentrations the photoconductivity can be calculated using the mobility model of DORKEL and LETURCQ [2] . The minority carrier lifetime can be extracted from the transient of the photoconductivity after Gopt is set to zero. advantages compared to SRH simulations or PC1D lifetime is not a parameter, but a direct result non steady state can be simulated as well an arbitrary number j of defect levels can be included The numerical simulation tool is suited for simulation of injection and temperature dependent measurements, for investigating the trapping effect on lifetime and photoconductivity and for the comparison of MDP and µPCD or other measurement conditions. Summarizing, this simulation tool enables to make lifetime measurements more comparable and to achieve a better understanding of the results. Fig. 2: varying Et Fig. 3: varying Nt Fig. 4: varying σp More information about these simulations can be found in: [1] T. Hahn, Thesis, TU Bergakademie, 2009 [2] J. M. Dorkel and P. Leturcq, Solid-State Electronics 24, 821-825 (1981) Matching Products MDP series MDPmap Precision Lifetime Charachterization with Exceptional Sensitivity Learn more MDP series MDPspot Quick and Simple Lifetime Measurement Made Easy Learn more MDP series MDpicts pro High-Resolution, Temperature-Dependent Lifetime Measurement System for Precise Material Characterization Learn more MDP series MDPpro 850+ Advanced Solution for Quality Control of Monocrystalline Silicon Ingots, Bricks, and Wafers Learn more MDP series MDPlinescan Versatile OEM Unit for Lifetime Measurements on Silicon Samples, from Bricks to Processed Wafers Learn more MDP series MDpicts Temperature-Dependent Lifetime Measurement System for Advanced Material Analysis Learn more RES series RESmap High-Precision Resistivity Mapping System for Accurate Material Analysis Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Application

Light Beam Induced Current (LBIC)

Light Beam Induced Current (LBIC) Light Beam Induced Current (LBIC) is a primarily in the photovoltaic sector well established method for the spatial resolved measurement of recombination active defects in ready-progressed solar cells. The proceeding is based on the measurement of the local short circuit current Isc in the cell, which is produced through appropriate excitation. For the measurement the solar cell is contacted and locally irradiated with laser light. Advantages are the simple buildup and the high resolution, disadvantage is the exigency of contacting the sample, for which reason only ready-progressed cells can be examined. Predictions about lifetime, mobility or defect details are possible. From the measured short circuit current the external quantum efficiency can be determined via: \(EQE = \cfrac{I_{SC}\cdot h \cfrac{c}{\lambda}}{P \cdot e}\) where P is the laser power and l the wavelength. The external quantum efficiency depends on the properties of the cell volume but also on the reflection properties of the surface. If the reflection can be neglected the following mechanism determines the EQE: recombination of minority carriers in the volume recombination of minority carriers at the surfaces at the front and the back shunts in the solar cell The internal quantum efficiency IQE includes the reflection of the light at the surface: \(IQE = EQE\cfrac{1}{1 - R(\lambda)}\) In order to determine the diffusion length, it is necessary to measure IQE for at least 4 different wavelengths, which should differ in the penetration depth. The slope of 1/IQE vs. 1/a is the reciprocal of the effective diffusion length. Fig. 1: internal quantum efficiency of a solar cell measured with 4 different wavelength Related Solutions and Industries: Epitaxial Layers & Thin Films , Photovoltaic Matching Products MDP series MDpicts pro High-Resolution, Temperature-Dependent Lifetime Measurement System for Precise Material Characterization Learn more MDP series MDPpro 850+ Advanced Solution for Quality Control of Monocrystalline Silicon Ingots, Bricks, and Wafers Learn more MDP series MDPpro Advanced Lifetime Measurement System for Quality Control and Material R&D on Semiconductors Learn more MDP series MDPmap Precision Lifetime Charachterization with Exceptional Sensitivity Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

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Luminescence Dating and Dosimetry

Luminescence Dating and Dosimetry TL/OSL series TL/OSL series lexsygsmart Learn more TL/OSL series lexsygresearch Learn more TL/OSL series Xray Dose Learn more TL/OSL series myOSLraser 2.0 Learn more TL/OSL series TLDcube Learn more TL/OSL series Dos'ASAP Learn more TL/OSL series PSLfood Learn more TL/OSL series myOSLraser 4.0 Learn more TL/OSL series myOSLautomatic 50 Learn more TL/OSL series myOSLautomatic 500 Learn more TL/OSL series myOSL 4000 Learn more TL/OSL series myOSLchip Learn more Discover more of the TL/OSL series Applications Learn more Software Learn more Projects Learn more Publications Learn more We provide advanced luminescence measurement solutions for precise dating, dosimetry, material research, and radiation protection, delivering exceptional sensitivity and reliability. Ing. Thanga Kumar Sales Director Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Industry

Luminescence Dating and Dosimetry

Luminescence Dating and Dosimetry Measuring Age and Radiation Exposure Cutting-Edge Technology for Accurate Age Determination and Dosimetry Freiberg Instruments specializes in advanced luminescence dating and dosimetry solutions, providing precise tools for determining the last exposure of mineral grains to light or heat. Cutting-edge equipment, including the lexsygresearch and lexsygsmart readers, supports applications in geology, archaeology, and radiation monitoring. These instruments enable accurate sediment and artefacts dating while also offering advanced dosimetry solutions like thermoluminescence and solid-state dosimetry. With a strong focus on innovation, Freiberg Instruments ensures high sensitivity, reliability, and versatility, empowering researchers across various scientific disciplines. Key Advantages High Sensitivity and Precision Our instruments, such as the lexsygsmart TL/OSL reader, are designed to achieve exceptional measurement precision, with capabilities of reaching better than 1%. This high sensitivity ensures accurate detection of luminescence signals, which is crucial for reliable dating and dosimetric assessments Versatility Across Applications Our products support a wide range of applications, including radiation protection dosimetry, solid-state dosimetry, geological and archaeological dating, and more. This versatility allows to utilize a single system for multiple purposes, enhancing efficiency and cost-effectiveness. Advanced Modular Design The lexsygresearch TL/OSL reader features a flexible modular system, allowing users to tailor the instrument to their research needs. Various stimulation and detection units can be integrated for comprehensive luminescence measurements. User-Friendly and Automated Operation Our instruments are designed with intuitive software and automated features that simplify complex luminescence measurements. With minimal manual intervention, users can conduct precise analyses efficiently, reducing errors and improving reproducibility. Our Industry-Leading Solutions TL/OSL series Explore more lexsygsmart Learn more lexsygresearch Learn more myOSLchip Learn more myOSLraser 4.0 Learn more myOSLraser 2.0 Learn more myOSLautomatic 500 Learn more myOSL 4000 Learn more myOSLautomatic 50 Learn more TLDcube Learn more PSLfood Learn more Xray Dose Learn more Dos'ASAP Learn more Expertise in Materials Quartz Feldspar BeO LiF:Mg Ti CaF₂:Mn and more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com Discover More Solutions Crystal Growth and Processing Learn more Epitaxial Layers & Thin Films Learn more Photovoltaic Learn more Research and Development Learn more

Application

Luminescence spectroscopy

Luminescence spectroscopy To investigate the luminescence properties of materials. Luminescence spectroscopy is used to investigate the luminescence properties of materials and thus allow more precise definitions e.g. of measurement parameters (e.g. detection ranges). It can help to better define the involved traps and centres, and contributes to the understanding of luminescence processes. Discher M & Woda C (2014) Thermoluminescence emission spectrometry of glass display in mobile phones and resulting evaluation of the dosimetric properties of a specific type of display glass. Radiation Measurements 71, 480-484. Tan K, Liu Z, Zeng S, Liu Y, Xie Y & Rieser U (2009) Three-dimensional thermoluminescence spectra of different origin quartz from Altay Orogenic belt, Xinjiang, China. Radiation Measurements 44, 529-533. TL-spectra from mobile phone glasses measured with a lexsyg research spectrometer equipped with an Andor Technology iDus 420 Series CCD camera (from Discher & Woda, 2014). Matching Products TL/OSL series lexsygresearch The most advanced TL/OSL reader Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

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Luminescene dating, research, dosimetry

Luminescene dating, research, dosimetry Our R&D projects RAMSES-4-CE 04/2020 - 03/2024 Raman Absorption and eMission Spectroscopy in an intEgrated Sensor Circular Economy As a follow-up to the very successful InSPECtor project, Freiberg Instruments is developing a Raman sensor in this project. Together with the partner Helmholtz center Rossendorf HZDR and TU Bergakademie Freiberg and the Geological Survey of Finland GTK, the sensor will be implemented in a spectroscopy-based multi-sensor system for the recycling and re-mining industry. We focus on (1) the development of a Raman sensor unit, (2) the integration into the already developed LiF-HSI sensor system (inSPECtor) and (3) advanced data processing including multi-source data fusion and machine learning. The core innovation contributes to the digitalization of recycling streams. It allows for the identification of critical raw materials as well as energy stored in plastics as key inputs for simulations of energy and material cycles required for the transition towards a Circular Economy. Automated Lithium-Fluorid OSL Low-Dose-Measurement (ALFON) 2020/12/01 - 2021/11/30 The increasing use of ionising radiation in medical application (CT/X-ray; treatment) and other aspects of modern societies (radiation facilities, power plants), requires the active and passive measurement of radiation. This is paired with more and more stringent regulations on monitoring of radiation exposure and levels. Passive dosimeters are the most widespread and cheapest way to monitor the exposure to ionising radiation of large numbers of people. However, the widely used technique of film dosimetry was replaced by thermally stimulated luminescence (TL), which in turn is now out-phased in personnel dosimetry and slowly replaced by optically stimulated luminescence (OSL). New techniques require the development of new automated measurement equipment, e.g. myOSLraser. Especially dosimetry services, which are handling thousands of dosimeters every day, are faced with large costs of such transitions to new techniques, which are required to keep up with legislation and developments. This is accounted for in the ALFON project by the development of a 4-element OSL-dosimeter, which is shaped like the widespread used Panasonic 4-element TLDs, and thus will allow the continued use of peripheries for Panasonic TL-dosimetry with UD-readers in existing facilities. The artificial phosphors BeO and LiF are providing radiation responses close to human tissue and are therefore the material of choice in personnel dosimetry. The project aims to provide dosimeters and measurement equipment exceeding the requirements of EN/IEC 62387, especially on the detection of very low radiation doses. This will be the first commercial use of the new OSL material based on LiF (Sadel et al., 2019), and its favourable properties paired with the possibilities of 4 measurement positions in a single dosimeter, which opens many possibilities beyond the measurement of Hp0.07 and Hp10. In addition to develop optimized measurement conditions of the new material, the capacities for OSL-measurement are scaled up from the my OSLraser 2-element BeO reader (200 dosimeters), with automations for 500 and 4000 dosimeters. This requires 3-axle feeding mechanisms and a parallel line for dosimeters not meeting user or regulatory specifications, which have to be sorted out for inspection or re-measurement. The option to measure the same dosimeter again is special in OSL-dosimetry and not possible in TL-dosimetry, thus fulfilling the legal requirements in some countries.. The 2-element OSL-reader 'myOSLraser' for BeO is used as the basis of the development of the larger 4-element equipment. Reference: Sądel M, Bilski P & Kłosowski M (2019) Optically stimulated luminescence of LiF:Mg,Cu,P with different dopant concentrations. Radiation Measurements 123, 58-62. SISor - Sensor for Intelligent Sorting 2018/05/01-2020/04/30 The separation of waste, especially from electronic and electric devices (WEEE) is a topic, which has drawn a fast-growing interest on a global scale. Due to decreasing availability and rising production costs for raw materials such as rare earth elements (REEs) and precious metals, the mining of secondary resources from waste gained extremely in importance. In 2016, 44.4 million metric tons of e-waste were generated globally, an amount which is expected to increase steadily for the next decades. Within the SISor (Sensors for Intelligent Sorting) project the core aim is the development of an integrated sensor system for the automated detection of raw materials in the WEEE. An improved detection of valuable materials such as Au, Cu and rare earth elements would strengthen the sorting process of the e-waste, increasing the separation success tremendously. The consortium of the Helmholtz institute HZDR-HIF, the Canadian company Telops Inc. and Freiberg Instruments is going to develop a modular system, containing sensors based on hyperspectral mid-wave infrared (HS-MWIR) absorption spectroscopy and laser-induced fluorescence (LIF) emission spectroscopy. Both techniques are high-sensitive, non-invasive and can be optimized for fast-imaging. Thus, larger streams of recyclates could be processed more accurately in shorter time. This project is funded by the BMWi . inSPECtor - integrated Spectroscopy Sensor System The core aim of this project is to gather the respective partner competences to upscale an innovative product based on emission and absorption spectroscopy able to identify and map critical elements as rare earth elements in primary resources as drilling cores and secondary products. YouTube Here you can find external content of the provider Google LLC. To be able to display these, we need your consent. privacy policy Show provider content inSPECtor – integrated Spectroscopy Sensor System Development of measurement equipment for OSL-dosimetry with BeO 2016/03/15 - 2018/09/14 Personnel working in environments with potential exposure to artificial or increased radiation, like hospitals with CT/X-ray equipment, nuclear power plants, radiation facilities, etc., are required to be monitored for their radiation exposure. The availability of film material, which is one of the most important materials in such personal dosimetry, is not warranted on the long term. Other materials have been sought as possible replacements. The dependency of sintered BeO to radiation energy is close to tissue. Because of this favourable property, BeO is one of the phosphors of choice in personal dosimetry. Combined with the technique of Optically Stimulated Luminescence (OSL) for readout, BeO-OSL dosimetry is believed to supersede film dosimetry and at least to some extend thermoluminescence (TL) dosimetry. The projects aims towards the development of OSL-equipment (EN/IEC 62387) to efficiently read out a new 2-element BeO-OSL dosimeter (Hp07 and Hp10). The modular equipment provides the manual readout of a single BeO-dosimeter. An automation attachment provides the opportunity to measure batches of 20 dosimeters stored in magazines. A total of 10 of such magazines are located in a wheel, which is software driven for dosimeter measurement according to user definitions. In OSL dosimetry it is sufficient to measure part of the signal, which allows re-reading, for dose determination. This usually requires the zeroing before a dosimeter can be used again. Instead of a separate device the bleaching to zero will be achieved within the OSL-reader, which speeds up the process. For calibration purposes a special beta source for irradiation of the dosimeters is constructed. Some application require on-site immediate analysis (e.g. in a phantom) and dose determination. This will be achieved by a single-element BeO-OSL equipment, which is handheld and can be independently operated from batteries, providing immediate dose assessment. Reference Bos AJJ (2001) High sensitivity thermoluminescence dosimetry. Nuclear Instruments and Methods in Physics Research B 184, 3-28. READ 2016/06/01 - 2019/05/31 READ - R are EA rth ceramic phosphors for 3D optical readout D osimetry Dosimetry for radiation processing applications, as used e.g. in sterilization procedures for medical devices, is often tedious due to the constraints of quality assurance and fulfillment of the required standards (e.g. ISO 11137, ISO/ASTM 51204, 51608, 51649, …). It is moreover time consuming. As an industrial application it is desired to release irradiated products as quickly as possible. The project aims at the development of a handheld measurement device, which will provide instant dose information for user defined numbers of dosimeters attached to the product/product pallet, which will allow the immediate release if the specified requirements are met. While this can provide 3-D dose information based on the selected measurement spots, more details are sometimes required for product objects of very complex geometries, where it is essential to verify the dose at positions where dosimeters cannot be attached. For this purpose, a dosimeter material which can be sprayed onto surfaces and measured with a 3D-dose-scanner will be developed. The dosimetric properties of doped NaYF4 will be employed to develop dosimeters as labels and as spray. These ceramic phosphors exhibit an upconversion effect, denoting the transformation of long-wavelength (infrared or near-infrared) light into short-wavelength radiation (luminescence) with higher photon energy. Here, a dependency of the lifetime of the luminescence with dose (Figure 1) has been shown (Härtling et al., 2012; Reitzig et al, 2013; 2016). This allows the use of a broad dose range of few kGy to 150 kGy (Figure 2). Its high stability under ambient conditions corroborates the application of the material for industrial dosimetry, where the dose information is retained and readout is contactless. These properties make the material a promising candidate for optical dosimetry below 5 kGy, a dose range addressed so far only with more complex non-optical systems. Publication Christiane Schuster, Florent Kuntz, Alain Strasser, Thomas Härtling, Kay Dornich, Daniel Richter 3D relative dose measurement with a μm thin dosimetric layer, Radiation Physics and Chemistry, 2020,109238, ISSN 0969-806X Keywords: High dose dosimetry, Optical dosimetry, gamma irradiation, Electron beam irradiation, X Ray irradiation, ceramic phosphors, luminescence decay time, industrial radiation processing. Fig 1: Luminescence lifetime reduction after a 300 kGy electron irradiation (from Reitzig et al., 2016). Fig 2: Dose dependency of the luminescence lifetime of NaYF4 (from Reitzig et al., 2016). References Härtling, T., Reitzig, M., Mayer, A., Wetzel, C., Röder, O., Schreiber, J., and Opitz, J. (2012). Nondestructive testing of electron beam sterilization by means of an optically active marker material. In "Optical Components and Materials IX." pp. 825713-825713-6. Proceedings SPIE 8257. Reitzig, M., Goodband Rachel, J., Schuster, C., and Härtling, T. (2016). Optical electron beam dosimetry with ceramic phosphors as passive sensor material for broad dose ranges. tm - Technisches Messen 83, 171-179. Reitzig, M., Härtling, T., Winkler, M., Powers, P., Derenko, S., Toro, C., Röder, O., and Opitz, J. (2013). Time-resolved luminescence measurements on upconversion phosphors for electron beam sterilization monitoring. In "Smart Sensor Phenomena, Technology, Networks, and Systems Integration." (K. J. Peters, W. Ecke, and T. E. Matikas, Eds.), pp. 86930R-86930R-7. Questions? I'm here for you. Dr. Nadine Schüler Head of Research & Development +49 3731 419 540 LinkedIn profile Contact now Discover More Solutions Crystal Growth and Processing Learn more Epitaxial Layers & Thin Films Learn more Photovoltaic Learn more Luminescence Dating and Dosimetry Learn more