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Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygresearch Configuration options PMT detection unit PMT detection unit High-precision detectio

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygresearch Configuration options Peltier cooling Peltier cooling for radiation defect characte

Penetration depth of different laser wavelength in silicon In silicon laser light with different wavelength has different penetration depth, hence the right laser should be used for different applicat

Photostimulated Luminescence (PSL) Used in wide range of dosimetric applications. Photostimulated Luminescence (PSL or POSL) is also called Optically Simulated Luminescence (OSL) and can be used for a

Photoconductivity When light of sufficient energy is absorbed by a semiconductor, the number of free electrons and holes changes and raises the electrical conductivity of the semiconductor. Photocondu

Photoconductivity measurements and trap analysis of wide bandgap nitride semiconductors Equipped with a 355 nm laser (μ-PCD) or a 375 nm laser diode (MDP), the MDPmap as well as the MDpicts from Freib

Photoconductivity measurements of implanted samples Implantation of B and P are used for many applications in the microelectronic industry, but so far there was no method available to check the homoge

Photovoltaic Overcoming Industry Challenges with Cutting-Edge Metrology Solutions Advanced Measurement solutions for maximum yield and efficiency In the last years the overflow of global competitors a