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Product

Angle Sorter

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products X-ray Diffraction Angle Sorter Angle Sorter This product launching soon Interested? Get in touch! Contact now Skip menu Quick navigation Applications Technology Contact Applications Automatic Wafer Sorting To ensure the exceptional performance required for semiconductors, every wafer must undergo thorough testing. The Omega-Scan method, known for its speed and precision, is ideal for fully… Learn more Interested? Our experts are happy to assist you. Get in touch! Contact us now! Technologies Omega-scan Ultra-Fast Orientation Measurement for Single Crystals Learn more Theta-scan Precision X-ray Method for Single Crystal Orientation Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

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Application Form

Application Form Join Us and Shape the Future of Metrology Think you’ve got what it takes? Apply now and share your references, CV, certificates, salary expectations, and desired start date with us.

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Applications

RAMSES Aplications Advanced identification of polymers and semiconductors Learn more

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Applications

RESmap Applications High precision Resistivity Measurement Learn more

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Applications

Lexsyg Applications Radiation protection dosimetry TL, OSL, Radioluminescence, Electron Spin Resonance (ESR), Neutron dosimetry, Food irradiation and clinical dosimetry Thermoluminescence (TL) Learn more Photo/ Optically Stimulated Luminescence (PSL + OSL) Learn more Radioluminescence Learn more Electron Spin Resonance (ESR) Learn more Neutron dosimetry Learn more Food Irradiation Control Learn more Medical dosimetry Learn more Solid state dosimetry Luminescence spectroscopy, Time resolved luminescence, Spatially resolved luminescence and Electron Spin Resonance (ESR) Luminescence spectroscopy Learn more Spatially resolved luminescence Learn more Time resolved luminescence Learn more Electron Spin Resonance (ESR) Learn more Geology OSL, IRSL, Single grain/spatially resolved luminescence, Radiofluorescence, Electron Spin Resonance (ESR) and Pulsing Optically stimulated Luminescence dating of quartz (OSL) Learn more Infrared stimulated Luminescence dating of feldspar (IRSL) Learn more Single grain/spatially resolved luminescence dating Learn more Radiofluorescence Learn more Electron Spin Resonance (ESR) dating of quartz Learn more Pulsing: mixed mineral samples Learn more Archaeology Luminescence methods provide the age of archaeological sites or objects Flint and other heated rocks Learn more Ceramics, pottery, bricks and statues Learn more Unheated rock surfaces Learn more Tooth enamel and quartz grains Learn more Sediment dating Learn more

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Applications

PID Applications Production Monitoring Learn more EVA Evaluation Learn more Solar Cell Classification Learn more Mini-module Classification Learn more Glass Evaluation Learn more

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Applications

MDP Applications The minority carrier life time is sensitive for all kinds of electrically active defects in semiconductors and is therefore suited for a wide variety of applications. Photoconductivity measurements and trap analysis Learn more Resistance measurements on wafers and bricks Learn more Light Beam Induced Current (LBIC) Learn more Minority carrier Lifetime maps on 450 mm wafers Learn more Iron concentration determination Learn more Microwave Detected Photo Induced Current Transient Spectroscopy Learn more Minority carrier lifetime measurements on SiC Learn more Investigation of material quality of GaAs Learn more p/n detection in bricks Learn more Detection of CrB in silicon Learn more Detection of BO2 in silicon Learn more Trap concentration determination Learn more Injection dependent measurements Learn more Investigation of defect levels in InP Learn more Inline metrology of mc-Si bricks Learn more Highly spatial resolved inline metrology on Multicrystalline Silicon Learn more Determination of passivation homogeneity and surface recombination vel Learn more Photoconductivity measurements of implanted samples Learn more Lifetime determination of epitaxial silicon thin-film layers Learn more

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Applications

SPS/SPV Applications Silicon photovoltaic – Wafer check after diamond wire sawing Learn more Contactless detection of bulk polarization phenomena in semiconductors Learn more Electronic transitions in diamond Learn more Characterization of Ga2O3 Learn more Investigation of photocatalytic materials (BiVO4) Learn more Study and monitoring of photocatalytic materials (TiO2) Learn more Contactless characterization of SiC, GaN and AlGaN Learn more Defects in 4H-SiC Learn more Defects and charge dynamics in 3C- and 4H-SiC investigated by surface Learn more

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Applications

XRD Applications Advanced X-Ray Solutions for Production and R&D Precision X-Ray Diffractometers for Industrial Crystal Analysis Freiberg Instruments designs and manufactures state-of-the-art X-ray diffractometers tailored for macroscopic single crystals used in industrial crystal growth and production. Our advanced solutions support diverse applications in microelectronics, optics, and electromechanics. We offer cutting-edge methods for precise orientation determination and comprehensive surface quality assessment, ensuring the highest standards in crystal evaluation. Read more Crystal Surface Orientation Mapping Learn more Automatic Wafer Sorting Learn more 3D Mapping of Crystalline Turbine Blades Learn more Quartz Crystal processing Quartz Bar Aligning Learn more Quartz Blank Sorting Learn more XRD for large crystals, ingots and boules Samples with a wide variety of geometry & size Learn more Marking and measuring of in-plane directions Learn more Crystal quality Learn more NLO Materials: Crystal Quality & Optical Axis Orientation Learn more

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Archaeology

Archaeology Flint and other heated rocks Learn more Ceramics, pottery, bricks and statues Learn more Unheated rock surfaces Learn more Tooth enamel and quartz grains Learn more Sediment dating Learn more