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myOSL blister holder

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry myOSLraser myOSLraser 2.0 myOSL blister holder myOSL blister holder A blister which protects the OSL dosimeter against water, dust and dirt. Interested? Get in touch! Contact now Another whole body badge solution is the myOSL dosimeter sealed in a blister which protects the OSL dosimeter against water, dust and dirt. It also provides the possibility to add a label on the front and rear side of the OSL blister which can show the information of the wearing person like name, department, wearing period, etc. The myOSL dosimeter is also protected against unauthorized opening of the dosimeter which could influence the dose results (double-protection). Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Product

myOSL 4000

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry myOSLautomatic myOSL 4000 myOSL 4000 An automatic cabinet which provides a loading capacity of up to 4000 OSL dosimeters Exclusively through RadPro International Contact for demo Manual Skip menu Quick navigation Features Software Contact Features & Benefits MyOSL 4000 is our automatic cabinet which provides a loading capacity of up to 4000 OSL dosimeters. The system can be equipped with up to two myOSLraser 4.0 for fast processing. Alternatively one of the myOSLraser 4.0 can be temporary replaced with our myOSLirradiator 4.0 for automatic dosimeter calibration. Another upgrade is the sorting option where dosimeters will be placed in up to 2 different magazines according to the reasons for rejection. With sorting option the myOSL 4000 has a loading capacity up to 3500 OSL dosimeters. myOSL 4000 – Exclusively through RadPro International This product is distributed by our trusted partner. Contact for demo Software OSLdosimetry OSLdosimetry is a user friendly operating software which allows OSL dose measurements as standard user or calibration and setting features for professionals (password protected). The… Learn more myOSL 4000 – Exclusively through RadPro International This product is distributed by our trusted partner. Contact for demo

Product

lexsygsmart

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygsmart lexsyg smart The most sensitive TL/OSL reader Interested? Get in touch! Contact now Product Sheet Skip menu Quick navigation Features Applications Options Software Contact Features & Benefits Compact design: provides thermal and optical stimulation for up to 3 different wavelengths No crosstalk: independent operation of measurement chamber and sample changer ensures absence of stimulation and radiation crosstalk Flexibility: Software controlled switch of detection filters within a measurement sequence Homogeneity : highly homogeneous and stabilized optical stimulation provides identical measurement conditions Accessibility: IP based system allows remote operation and technical support from anywhere in the world Reference list – TL/OSL reader Applications Thermoluminescence (TL) Thermoluminescence (TL) is a backbone in radiation protection dosimetry with a long tradition and used for a wide range of dosimetric purposes, including accident dosimetry, retrospective… Learn more Photo/ Optically Stimulated Luminescence (PSL + OSL) Photostimulated Luminescence (PSL or POSL) is also called Optically Simulated Luminescence (OSL) and can be used for a wide range of dosimetric purposes. It is gaining importance in radiation… Learn more Neutron dosimetry Active dosimeters, like rem-mteters, superheated emulsions and electronic personal dosemeters can be used to measure neutron fields. But frequently passive dosemeters are used to determine… Learn more Food Irradiation Control Food stuff often is irradiated with ionizing radiation for sterilisation purposes. This requires the detection and estimates of the applied doses. The attached mineral dust or the food itself… Learn more Medical dosimetry Ionizing radiation from a large variety of isotopic sources, as well as accelerators, electron beams, etc. are increasingly used in radiotherapy. Clinical diagnostics employing ionizing radiation… Learn more Optically stimulated Luminescence dating of quartz (OSL) Age range, Few years (depending on signal intensity and sensitivity of equipment for which the lexsyg systems are especially developed), Up to ~150-200,000 years (depending on dosimetry),… Learn more Infrared stimulated Luminescence dating of feldspar (IRSL) Due to higher saturation doses the age range is larger than for OSL, Internal dose rates in K-feldspar reduce dependency on external dose rate and water content, Might suffer from an anomalous… Learn more Pulsing: mixed mineral samples Sometimes mineral separation in sediment or solid samples is not possible (polymineral samples), especially in cases of intergrowth of minerals. Pulsing (i.e. short light stimulation) the… Learn more Flint and other heated rocks Rocks containing amorphous/microcrystalline SiO2 can be dated by luminescence methods when they have been heated to approximately 400°C. Such temperatures, whether accidentally or deliberately,… Learn more Ceramics, pottery, bricks and statues While the typology of ceramics is a backbone of many archaeological chronologies, establishing the age directly for certain types of ceramics is sometimes required. Optically Stimulated… Learn more Unheated rock surfaces Granite or other quartz/feldspar containing rocks are preferentially dated with spatially resolved luminescence, Marble, limestone surfaces are dated with Optically Stimulated Luminescence (OSL)… Learn more Sediment dating Optically Stimulated Luminescence (OSL, TT-OSL) dating of quartz grains from sediments, Infrared Stimulated Luminescence (IRSL, pIRIR, IR-RF) dating of feldspar grains from sediments, Trench… Learn more Interested? Our experts are happy to assist you. Get in touch! Contact us now! Accessories & Options Configuration options Irradiation sources Thermal stimulation (TL) Pulsed OSL (10 µs) Red stimulated quartz OSL Filter wheel PMT detection unit Optional accessories Additional sample carousel Sample cups/discs Aliquot preparation kit LED head lamp Air compressor Software LexStudio 2.0 - Operating software Modern, professionally designed user interfacensitivity: Based on user feedback a new graphical user interface which combines clear arrangement and usability is developed by Freiberg… Learn more LexEva - Evaluation software LexEva is a newly released evaluation software developed for analysis in luminescence research and dating. LexEva was adapted to the "Luminescence" package developed by the R. Luminescence… Learn more TLStudio - Operating & Evaluation software User account management system, Transperent workflow, Professionally designed user interface, Intelligent parameter selection, Live data visualization, Easy programming of individual and… Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Product

lexsygresearch

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygresearch lexsyg research The most advanced TL/OSL reader Interested? Get in touch! Contact now Product Sheet Skip menu Quick navigation Features Applications Options Contact Features & Benefits Modular design: Interchangeable OSL stimulation units (up to 3 wavelengths per OSL), accommodates up to 4 detection units and up to 3 irradiation sources No crosstalk: Independent operation of measurement chamber and sample reservoir ensures absence of both stimulation and radiation crosstalk Nonstop operation: Ability to load and unload samples while another sample is undergoing analysis/treatment inside the measurement chamber Flexibility: Software controlled switch of detection filters within a measurement sequence Homogeneity: Highly homogeneous and stabilized optical stimulation provides identical measurement conditions Accessibility: IP based system allows remote operation and technical support from anywhere in the world Easy upgrade: Modular design allows future expansion of device capabilities by easily adding components Reference list – TL/OSL reader Applications Thermoluminescence (TL) Thermoluminescence (TL) is a backbone in radiation protection dosimetry with a long tradition and used for a wide range of dosimetric purposes, including accident dosimetry, retrospective… Learn more Photo/ Optically Stimulated Luminescence (PSL + OSL) Photostimulated Luminescence (PSL or POSL) is also called Optically Simulated Luminescence (OSL) and can be used for a wide range of dosimetric purposes. It is gaining importance in radiation… Learn more Radioluminescence Luminescence emitted during exposure to ionizing radiation can be employed for online dosimetry, e.g. in brachytherapy.Al2O3:C or BeO attached to optical fibres for online dosimetry can serve… Learn more Neutron dosimetry Active dosimeters, like rem-mteters, superheated emulsions and electronic personal dosemeters can be used to measure neutron fields. But frequently passive dosemeters are used to determine… Learn more Food Irradiation Control Food stuff often is irradiated with ionizing radiation for sterilisation purposes. This requires the detection and estimates of the applied doses. The attached mineral dust or the food itself… Learn more Medical dosimetry Ionizing radiation from a large variety of isotopic sources, as well as accelerators, electron beams, etc. are increasingly used in radiotherapy. Clinical diagnostics employing ionizing radiation… Learn more Luminescence spectroscopy Luminescence spectroscopy is used to investigate the luminescence properties of materials and thus allow more precise definitions e.g. of measurement parameters (e.g. detection ranges). It can… Learn more Spatially resolved luminescence Measuring luminescence with EMCCD camera allows for the spatial differentiation of luminescence signals. Different minerals, mineral phases, radiation hot spots etc. can be determined in granular… Learn more Time resolved luminescence Time resolved luminescence measurements allow the determination of the life-times of electron states and thus description of the kinetics involved. This allows the correlation to different… Learn more Optically stimulated Luminescence dating of quartz (OSL) Age range, Few years (depending on signal intensity and sensitivity of equipment for which the lexsyg systems are especially developed), Up to ~150-200,000 years (depending on dosimetry),… Learn more Infrared stimulated Luminescence dating of feldspar (IRSL) Due to higher saturation doses the age range is larger than for OSL, Internal dose rates in K-feldspar reduce dependency on external dose rate and water content, Might suffer from an anomalous… Learn more Single grain/spatially resolved luminescence dating Not every grain in a sediment sample reflects the same last bleaching and burial history. By analysing single mineral entities (whether grains or parts of it) different dose populations can be… Learn more Radiofluorescence Infrared-Radiofluorescence (IR-RF) is a technique for dosimetric dating of potassium feldspar to establish sedimentation ages. This method avoids some of the problems of other trapped-charge… Learn more Pulsing: mixed mineral samples Sometimes mineral separation in sediment or solid samples is not possible (polymineral samples), especially in cases of intergrowth of minerals. Pulsing (i.e. short light stimulation) the… Learn more Flint and other heated rocks Rocks containing amorphous/microcrystalline SiO2 can be dated by luminescence methods when they have been heated to approximately 400°C. Such temperatures, whether accidentally or deliberately,… Learn more Ceramics, pottery, bricks and statues While the typology of ceramics is a backbone of many archaeological chronologies, establishing the age directly for certain types of ceramics is sometimes required. Optically Stimulated… Learn more Unheated rock surfaces Granite or other quartz/feldspar containing rocks are preferentially dated with spatially resolved luminescence, Marble, limestone surfaces are dated with Optically Stimulated Luminescence (OSL)… Learn more Sediment dating Optically Stimulated Luminescence (OSL, TT-OSL) dating of quartz grains from sediments, Infrared Stimulated Luminescence (IRSL, pIRIR, IR-RF) dating of feldspar grains from sediments, Trench… Learn more Interested? Our experts are happy to assist you. Get in touch! Contact us now! Accessories & Options Configuration Options Automatic detector changer Irradiation sources Thermal stimulation Peltier cooling Pulsed OSL (10 µs) Red stimulated quartz OSL Filter wheel PMT detection unit InfraRedPhotoLuminescence (IRPL) X-ray Fluorescence (XRF) EMCCD Sample camera Spectrometry detection unit Bleaching/Solar simulation unit Ultra-fast pulsing (< 10 ns) Optional accessories Sample cups/discs Aliquot preparation kit LED head lamp Vacuum pump Air compressor Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Product

Xray Dose

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry Xray Dose Xray Dose Benchtop X-ray irradiator Interested? Get in touch! Contact now Product Sheet Skip menu Quick navigation Features Contact Features & Benefits Portable and easy-to-use design Automated ramping to ensure durability of X-ray tube Precisely defined sample irradiation Real-time monitoring of X-ray flux The dose rate can be linearly varied by a factor of ten by simply changing the current (0.1 – 1.0 mA) Hardening filter (e.g. Al) can be changed easily Compatibility with ESR quartz tubes (Ø = 3 – 6 mm, 135 mm long), petri dish and sample cups/discs Interface to MS 5000 ESR spectrometer and lexsyg TL/OSL reader, allows unlimited irradiation and measurement cycles Download Product Sheet PDF (962 KB) Application example OSL-signal (first 1s) response of Al₂O₃: C to different voltage settings and does. The linear signal response shows the reproducibility of delivered does by the X-ray under varying does rate (high voltage, kV) settings. (Richter et al., 2016) Excellent stability The temperature stabilization of the X-ray unit ensures stable and constant does rates over long periods. (modified after Richter et al., 2016) Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Product

XRDmap Pro

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products X-ray Diffraction XRDmap Pro XRDmap Pro Wafer Edition Inline wafer orientation mapping truly fab compliant Interested? Get in touch! Contact now Skip menu Quick navigation Features Applications Technology Software Contact Optimize wafer alignment inline for higher productivity. Ultra-fast hybrid X-ray optical metrology with proprietary algorithm Full automation featuring SMIF Loadports suitable for OHT connection Grows with your expansion: 70mm-230mm Wafersize flexibility Materials The XRDmap Pro Wafer Edition enables maximum value add by tuning subsequent processes such as epitaxy, lithography and implanting to the crystal orientation. This enables supplier process compliance and a smooth material flow by its ultra-fast measurement speed and seamless factory automation. Si Ge GaAs GaN Ga₂O₃ Diamond InP and more Features & Benefits 70–200mm Wafer Size 0.003˚ Offcut magnitude precision Flexible Loading and communication options Measured by opt. sensors Wafer Geometry Measured by opt. sensors Wafer Geometry Applications Crystal Surface Orientation Mapping Even within a single crystal, slight variations in crystal orientation can occur across the surface, often due to internal strains from lattice defects. Similarly, well-grown thin films can… Learn more Interested? Our experts are happy to assist you. Get in touch! Contact us now! Technologies Omega-scan Ultra-Fast Orientation Measurement for Single Crystals Learn more Software XRDStudio Multiple Operating ModesOperator Mode: Designed for fixed measurement parameters, ensuring a safe and streamlined workflow. Administrator Mode: Allows for the creation and modification of… Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Technology

XRDStudio

XRDStudio Cutting-Edge Software for Controlling X-ray Diffractometers User-Friendly and Advanced Operating Software Multiple Operating Modes Operator Mode : Designed for fixed measurement parameters, ensuring a safe and streamlined workflow. Administrator Mode : Allows for the creation and modification of measurement recipes, as well as adjustments for new materials. Intuitive Guided Interface Ensures a seamless and efficient workflow for users of all experience levels. Pre-Defined and Customizable Recipes Choose from a range of ready-made recipes or create custom ones to suit specific needs. Automatic Display of Results and Correction Values Instant visualization of measurement results along with automatic correction values to fine-tune crystal orientation. Mapping Capabilities Advanced mapping features for precise measurement analysis. Import/Export Functions Effortlessly import and export data for easy sharing and integration with other systems. Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Product

XRD-OEM

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products X-ray Diffraction XRD-OEM XRD OEM Fully automated in-line orientation and handling of ingots, boules, and pucks Exclusively through Malvern Panalytical Contact for demo Skip menu Quick navigation Features Applications Technology Software Contact Materials With XRD-OEM, a wide variety of materials can be precisely analyzed. Thanks to their flexibility and performance, our systems meet even the most demanding requirements. Si SiC GaAs and more Features & Benefits Ingots up to 450 mm diameter flat/notch detection large ingots Preset prior to sawing/grinding Ultra-fast crystal orientation measurement Ultra-fast crystal orientation measurement Ready for integration for any automation or processing system Designed for harsh environments (grinding, sawing) Compact, standard industrial interfaces Independent orientation measurement Measurements on flat surface or circumferences Optical notch detection Applications Orientation of silicon ingots: detection of flat and notch position prior to grinding diameter up to 8'' length up to 40 cm XRD-OEM – Exclusively through Malvern Panalytical This product is distributed by our trusted partner. Contact for demo Technologies Omega-scan Ultra-Fast Orientation Measurement for Single Crystals Learn more Theta-scan Precision X-ray Method for Single Crystal Orientation Learn more Software XRDStudio Multiple Operating ModesOperator Mode: Designed for fixed measurement parameters, ensuring a safe and streamlined workflow. Administrator Mode: Allows for the creation and modification of… Learn more XRD-OEM – Exclusively through Malvern Panalytical This product is distributed by our trusted partner. Contact for demo

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XRD surface mapping

XRD surface mapping Unlock Material Insights with XRD Surface Mapping X-ray diffraction (XRD) surface mapping is a powerful analytical technique widely used in material science, physics, chemistry, and engineering to characterize the crystalline properties and structural variations of materials across a defined surface. By systematically measuring diffraction patterns across different points on a sample’s surface, XRD surface mapping enables researchers to obtain detailed spatial information on crystallographic orientation, strain, phase distribution, and texture. This data is invaluable for applications ranging from thin-film analysis and semiconductor development to stress analysis in metals and composite materials. The ability to map these properties across a surface provides insights into uniformity, quality, and performance, making XRD surface mapping a critical tool in quality control, failure analysis, and research & development for advanced materials. Through this technique, scientists and engineers gain a deeper understanding of material behavior and can optimize properties for specific applications, driving innovation in industries such as electronics, aerospace, automotive, and biomedical engineering High-Resolution Crystallographic Mapping Non-Destructive Testing Real-Time Quality Control and Defect Detection Enhanced Performance Optimization Crystal Surface Orientation Mapping Learn more Automatic Wafer Sorting Learn more 3D Mapping of Crystalline Turbine Blades Learn more

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XRD for large crystals, ingots & boules

XRD for large crystals, ingots and boules Samples with a wide variety of geometry & size Learn more Marking and measuring of in-plane directions Learn more Crystal quality Learn more NLO Materials: Crystal Quality & Optical Axis Orientation Learn more