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Red stimulated quartz OSL

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygresearch Configuration options Red stimulated quartz OSL Red stimulated quartz OSL allows a

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Red stimulated quartz OSL

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygsmart Configuration options Red stimulated quartz OSL Red stimulated quartz OSL allows a sep

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Reference list – TL/OSL reader

Reference list – TL/OSL reader Indian subcontinent Ass.-Prof Dr Manoj Kumar Jaiswal, Department of Earth Sciences, Indian Institute of Science Education and Research, Kolkata, India Dr Manoj K. Rathor

Industry

Research and Development

Research and Development Versatile Measurement solutions to empower and accelerate your R&D progress As a spin-off of the technical university in Freiberg, Freiberg Instruments has a strong scientific

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Research and Development

Research and Development Driving Innovation Together Advancing Measurement Technology Through Collaboration Research and development (R&D) is at the core of what we do at Freiberg Instruments. We part

Application

Resistance measurements on wafers and bricks

Resistance measurements on wafers and bricks The resistivity is one of the most important electrical parameters of a material. It is a key parameter for the performance of semiconductor devices as e.g

Technology

Resistivity

Resistivity measurement and mapping Resistivity mapping and measurement The electrical resistivity directly depends on the density of the semiconductor and is therefore a useful parameter to monitor d

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Resistivity Mapping

Resistivity Mapping Accurate Material Analysis for Semiconductor Quality Control: The RES series Advanced resistivity mapping is essential for semiconductor quality control across materials like SiC,

Product

SDCOM

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products X-ray Diffraction SDCOM SDCOM Ultra-fast, top surface measuring crystal orientation in a compact package Exclusively through Malvern

Technology

SPV signal analysis: fits and simulations

SPV signal analysis: fits and simulations Charge dynamic simulations in photoactive materials, incl. heterojunction photoactive materials. We are currently developing simulation tools to enable first