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SPV-Picts SPV temperature dependence measurements Use this option to make SPV measurements at different temperatures between room temperature and 200°C. Temperature-dependent SPV measurements can be applied to measure activation energies or to investigate temperature dependent reactions/processes in situ. As an example heeling or introduction of defects at surfaces or in the bulk can be investigated in this way. For wide-bandgap semiconductors the onset energy of the SPV signal associated with the bandgap edge is normally not sharp and well defined. By varying the temperature, the onset energy can be measured at different temperatures, resulting in a better estimation of the bandgap edge energies. Some photocatalytic materials have engineered defect states that accelerate the separation of charges. In a high-volume production setup of photocatalytic materials with engineered defect states, the control plan for the activity of the defect states is critical-to-yield. By varying the temperature over a relatively narrow range (say 10°C), the activity can be efficiently tested. Furthermore, the photocatalyst material need to work over broad range of temperatures. This makes the SPV-Picts option almost indispensable for any research programme aiming to develop efficient photocatalytic materials. Matching Products SPS/SPV series HR-SPSmap with fixed energy excitation sources High-Resolution and Sensitive Surface Photovoltage Measurement Solutions Learn more SPS/SPV series HR-SPSmap with variable energy excitation source with a variable energy excitation source Learn more DPM series DPM100 Wide range double prism monochromator Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygresearch Configuration options Sample camera Sample camera The sample camera is designed to automatically record the appearance of the sample after luminescence measurements. Interested? Get in touch! Contact now The sample camera is designed to automatically record the appearance of the sample after luminescence measurements. For example: Visual inspection after luminescence data collection Use of image analysis for determining e.g. number of grains, coverage area, grain size distribution, color distribution The camera is mounted in a mechanical fixture that is vacuum tight, light tight and holds a diffuse light illumination system to assure proper white light illumination of the sample that is photographed. Technical details of the camera: TheImagingSource 1/2.5 “Micron CMOS 5Mp camera or similar camera (example: DFM 72BUC02-ML) Computar 3Mp f=25mm lens

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygresearch Optional accessories Sample cups/discs Sample cups/discs Excellent thermal conductivity provided by professionally manufactured sample cups made of stainless steel, aluminum or nickel Interested? Get in touch! Contact now Sample cups/discs are designed to provide excellent thermal conductivity. They are cleaned and vacuum sealed (20 pcs per/package) separately. Stainless steel VA 1.4301 most popular, for standard application maximum temperature: 710 °C Aluminum AlMg 3 low cost maximum temperature: 500 °C Nickel Ni 99.2 for experimental work low background measurements

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygsmart Optional accessories Sample cups/discs Sample cups/discs Excellent thermal conductivity provided by professionally manufactured sample cups made of stainless steel, aluminum or nickel Interested? Get in touch! Contact now Sample cups/discs are designed to provide excellent thermal conductivity. They are cleaned and vacuum sealed (20 pcs per/package) separately. Stainless steel VA 1.4301 most popular, for standard application maximum temperature: 710 °C Aluminum AlMg 3 low cost maximum temperature: 500 °C Nickel Ni 99.2 for experimental work low background measurements

Versatile Sample Handling: From Large Ingots to Tiny Crystals Diverse Geometries and Sizes of Crystalline Samples The industrial synthesis of single crystals begins with large, heavy boules and is processed down to smaller forms, such as wafers or blanks. In experimental growth, tiny cylinders are produced. Crystalline samples vary significantly in size and geometry, depending on the material and production scale Custom Holders for Synthetic Crystals Freiberg Instruments offers customized adaptations and sample holders designed to fit any sample size. This ensures easy orientation checking and precise adjustment of the crystal for the next stage in the processing workflow. Learn more Related Technologies: Omega-scan Matching Products XRD series DDCOM Ultra-fast, bottom surface measuring crystal orientation in a compact package Learn more XRD series SDCOM Ultra-fast, top surface measuring crystal orientation in a compact package Learn more XRD series Omega/Theta XRD for ultra-fast crystal orientation, crystal alignment in production, quality control, rocking curve measurements, material research and more Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

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Sediment dating When sediments cover an archaeological site they are exposed to light and the mineral grains are bleached.Such events can be dated by luminescence methods and the age employed to determine the age of an archaeological site through its related sedimen Optically Stimulated Luminescence (OSL, TT-OSL) dating of quartz grains from sediments Infrared Stimulated Luminescence (IRSL, pIRIR, IR-RF) dating of feldspar grains from sediments Trench sediment filling with OSL/IRSL With a suite of stimulation wavelengths the lexyg devices provide an all in one solution for many sediment and mineral types Profile of ice wedge in fine grained sediments suitable for Luminescence dating (photo Richter). Matching Products TL/OSL series lexsygsmart The most sensitive TL/OSL reader Learn more TL/OSL series lexsygresearch The most advanced TL/OSL reader Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Services Supporting Your Success At Freiberg Instruments, we are dedicated to helping you get the most out of your instruments. From tailored solutions to expert training and responsive technical support, our services are designed to keep your operations running smoothly and efficiently. Explore how we can support you in achieving reliable results and long-term success. Customization Solutions Built for Your Needs We modify standard devices or develop new ones to fit your specific requirements. Whether it’s adapting a system to your workflow or creating a custom solution for a unique application, we ensure your instruments are optimized for your processes. Learn more about Customization Automation Efficient Systems for Continuous Use Our automation solutions are designed for high-volume production and reliable operation. With seamless integration into production lines, they ensure consistent quality and efficiency, helping you scale your processes with confidence. Discover Automation Research and Development Driving Innovation Together Partner with us to develop new technologies and methods for advanced applications. Whether it’s creating prototypes, exploring new materials, or solving complex challenges, our R&D services help turn your ideas into reality. Explore Research & Development Training and Application Expertise Get the Most Out of Your Instruments We provide practical, easy-to-follow training tailored to your needs. Whether you’re an individual or a team, our sessions cover everything from instrument use to advanced analysis, giving you the skills to achieve better results. Enhance Your Knowledge Technical Support Here When You Need Us Our expert team is ready to assist you with any technical issues – big or small. With remote support, fast repairs, and local-language assistance, we minimize downtime and keep your systems running smoothly. Get Technical Support We boost your instruments' performance with proactive maintenance, expert support, and flexible solutions – saving time, cutting costs, and delivering reliable results. Your success matters to us. Martin Ferkinghoff Head of Service Can't find the service you're looking for? Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our enquiry tool or reach out via email: sales @ freiberginstruments.com Discover more Products Learn more Solutions Learn more Company Learn more

Silicon photovoltaic – Wafer check after diamond wire sawing Diamond wire sawing (DWS) is an established technology for wafering semiconductor ingots, as it has many advantages over other technologies, such as of slurry cutting. Some of these advantages include faster cutting speeds with higher cutting efficiency, production of thinner wafers with improved thickness uniformity, easier way to filter silicon debris for slurry recycling (if desired), and use of cutting wire for more than one cut. Diamond wire sawing uses a long (hundreds of kilometres) wire, impregnated with diamond flakes (grit) as a cutting medium. The cutting wire is made up of a stainless-steel core (80– 120 µm in diameter) that is coated with diamond flakes (8–25 µm in size) which are then bonded to the wire by a layer of electroplated Ni or a layer of a resin material. The as-sawn DWS wafer might look perfect to the naked eye, but the diamond wire and the strategy of moving the diamond wire through the ingot (speed and reciprocation), has a high impact on the quality of the as-sawn wafers as well as subsequent processes such as lapping, grinding or etching. For PV wafers in particular, there can be a huge difference in the sub surface damage over the as-sawn square wafer and this needs to be accounted for in the damage etch and texturing etch process step that proceeds the DWS process. SPV spectroscopy using the HR-SPS tool provides direct information about the quality of the as-sawn wafers – it can be used to find areas of wire snap-off, wire reciprocation and also provide a map with relation to subsurface damage depth. It is contactless and fast, allowing for an integration of the tool into a process line QC control of as-sawn wafers. Below is a shown an example for a 156 x 156 mm 2 pseudo square DWS PV wafer (n-type monocrystalline, 1-3 Ohm-cm). Figure 1 shows maps of the SPV height across the n-type PV wafer by illuminated with three different photons energies – the penetration depths of the photons into the wafer is approximately 0.1, 10 and 100 mm, respectively. Also shown are the relaxation time constant across the wafer – defined as the logarithmic SPV signal transient decay time after turning off the light. It is clear from the SPV maps (left side) that the wafer has varying degrees of subsurface damage across the wafer; the top part has more subsurface damage than the bottom part and the periphery also has more damage. This is to be expected because of the force of the wire is higher at the periphery of the ingot to be sawn. In the relaxation maps (right side), there is a distinct zone below the centre of the wafer towards the bottom. This distinct centre has a lower than expected relation time (-10%) and this probably marks the reciprocation process start. The SPV and relaxation maps complement each other and give a fingerprint of the state of the as-sawn PV wafer. Fig. 1. SPV maps (right) and relaxation time maps (left) for the same DWS wafer and illuminated with three different energies (wavelengths) Related Solutions and Industries: Epitaxial Layers & Thin Films Matching Products SPS/SPV series HR-SPSmap with fixed energy excitation sources High-Resolution and Sensitive Surface Photovoltage Measurement Solutions Learn more SPS/SPV series HR-SPSmap with variable energy excitation source with a variable energy excitation source Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Simulation of carrier profiles For measurements at thick samples like ingots, it is very important to simulate the carrier depth profile, that developes in the sample. The measured lifetime is strongly effected by this profile, so that this effect has to be taken into account. Simulation of carrier profiles in thick samples The measurement of thick samples as bricks leads to new questions and problems. One of these questions is how the carrier profiles that develops in a sample effect the lifetime measurements. To solve this problem, we developed a simulation tool for the modelling of carrier profiles. This tool consists of a partial differential equation system of the transport equations for electrons and holes and the Poisson equation. \(\frac{\partial}{\partial t}n(x,t)=\frac{\partial}{\partial x} \left[ -\mu_nn(x,t)\frac{\partial}{\partial x} \Psi(x,t) + D_n\frac{\partial}{\partial x}n(x,t) \right]+ G^o(x,t) - U(x,t)\) \(\frac{\partial}{\partial t}p(x,t)=\frac{\partial}{\partial x} \left[ \mu_pp(x,t)\frac{\partial}{\partial x} \Psi(x,t) + D_p\frac{\partial}{\partial x}p(x,t) \right]+ G^o(x,t) - U(x,t)\) \(\frac {\partial^2}{\partial x^2} \Psi (x,t) = -\frac{q}{\in_0\in_y} \left[ -n(x,t) + p(x,t)_\text{dot} \right]\) Transport equations for electrons and holes + Poisson equation The simulations for measurements with a long (typical MDP condition) or a very short light pulse (typical µ-PCD conditions) at thick unpassivated samples are shown in figure 1 and 2. It becomes clear, that the carrier profile of a long light pulse expands through a large volume of the sample, where as the carrier profile of the only 200 ns long light pulse is very surface near. This has a direct effect on the measured lifetime, since the surface recombination has a much stronger effect on the µ-PCD measurements. Figure 3 shows the quantitative effect of the surface recombination on the effective lifetime for both measurement conditions. The MDP measurements are less prone to the surface effect, so that MDP measurements are more suited for the investigation of bulk properties. Accordingly µ-PCD is an ideal method to investigate the surface properties of a sample. Fig.3: evaluated effective lifetimes as a function of bulk lifetime for both methods Matching Products MDP series MDPmap Precision Lifetime Charachterization with Exceptional Sensitivity Learn more MDP series MDPspot Quick and Simple Lifetime Measurement Made Easy Learn more MDP series MDpicts pro High-Resolution, Temperature-Dependent Lifetime Measurement System for Precise Material Characterization Learn more MDP series MDPpro 850+ Advanced Solution for Quality Control of Monocrystalline Silicon Ingots, Bricks, and Wafers Learn more MDP series MDPlinescan Versatile OEM Unit for Lifetime Measurements on Silicon Samples, from Bricks to Processed Wafers Learn more MDP series MDpicts Temperature-Dependent Lifetime Measurement System for Advanced Material Analysis Learn more RES series RESmap High-Precision Resistivity Mapping System for Accurate Material Analysis Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com