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Theta-scan Precision X-ray Method for Single Crystal Orientation Features of Theta-scan Pro allows to measure all crystalline materials, polytypes & orientations Contra at least 20 times slower than Omega-scan Advantages of this method are the relatively simple diffractometer alignment and its flexibility. The disadvantages are the rather long measurement time (some minutes) and the problem of finding enough reflections. Successful Theta Scans on at least two different lattice planes are needed to determine the complete crystal orientation. The reflections should be accessible to the diffractometer without moving the sample. Measurment procedure The angle between X-ray beam and detector is set to the reflection condition for a certain lattice plane that is given by the Bragg equation. To find the reflection, both X-ray and detector are moved coupled and simultaneously the sample is rotated. The direction of the lattice plane’s perpendicular is then calculated from the position of the reflection peak. There is no specific name for this method, thus we call it the "Theta-scan". Background: Bragg Equation The common XRD method for surface orientation determination is based on the Bragg equation: 2⋅ d ⋅sin(θ) = n ⋅λ which describes the relation between X-ray wavelength λ, lattice plane distance d , and the reflection glance angle θ. n indicates the diffraction order of the reflection. Related Applications: Crystal Surface Orientation Mapping , 3D Mapping of Crystalline Turbine Blades , Automatic Wafer Sorting Matching Products XRD series Wafer XRD for fully automated sorting, sample crystalline orientation, sample dimension, optical notch/flat and edge profile determination and more Learn more XRD series Omega/Theta XRD for ultra-fast crystal orientation, crystal alignment in production, quality control, rocking curve measurements, material research and more Learn more XRD series DDCOM Ultra-fast, bottom surface measuring crystal orientation in a compact package Learn more XRD series SDCOM Ultra-fast, top surface measuring crystal orientation in a compact package Learn more XRD series XRD-OEM Fully automated in-line orientation and handling of ingots, boules, and pucks Learn more XRD series Quartz Bar XRD Enable tight frequency specs in mass production Learn more XRD series Quartz Wafer XRD Enable tight frequency specs in mass production Learn more XRD series Quartz Blank XRD Enable tight frequency specs in mass production Learn more XRD series Angle Sorter This product launching soon Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Time resolved luminescence To investigate charge carrier dynamics, e.g. lifetimes Time resolved luminescence measurements allow the determination of the life-times of electron states and thus description of the kinetics involved. This allows the correlation to different centres and discrimination of processes. Employing excitation pulses of appropriate time length with adequate off-times for luminescence detection allows the separation of different luminescence signals, which might be related to different minerals (e.g. feldspar and quartz) and can be used for determining two different doses for a single sample (e.g. pulsed OSL for dating purposes). Frequency-domain life time measurements at nanosecond resolution Time-domain life time measurements at microsecond resolution Time-resolved ratiometric measurements Investigate quenching Chithambo ML (2007) The analysis of time-resolved optically stimulated luminescence: I. Theoretical considerations. Journal of Physics D: Applied Physics 40, 1874-1879. Chithambo ML (2007) The analysis of time-resolved optically stimulated luminescence: II. Computer simulations and experimental results. Journal of Physics D: Applied Physics 40, 1880-1889. Collier BB & McShane MJ (2013) Time-resolved measurements of luminescence. Journal of Luminescence 144, 180-190. Pagonis V, Chithambo ML, Chen R, Chruścińska A, Fasoli M, Li SH, Martini M & Ramseyer K (2014) Thermal dependence of luminescence lifetimes and radioluminescence in quartz. Journal of Luminescence 145, 38-48. Principle of pulsed excitation and emission of a dual fluorescence and phosphorescence measurement (from Collier & McShane, 2013) Matching Products TL/OSL series lexsygresearch The most advanced TL/OSL reader Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Tooth enamel and quartz grains Archaeological sites often contain teeth from animals or humans or the site is contained in quartz bearing sediment. The enamel can be dated with Electron Spin Resonance (ESR/EPR), but it is often required to combine this method with U-series dating. Tooth enamel to date an archaeological site Quartz grains to date the sedimentation which covers a site or is related to the archaeology Magnettech's high sensitivity ESR spectrometer MS 400 and MS 5000 Bahain, J.-J., Falgueres, C., Laurent, M., Voinchet, P., Dolo, J.-M., Antoine, P., and Tuffreau, A. (2007). ESR chronology of the Somme River Terrace system and first human settlements in Northern France. Quaternary Geochronology 2, 356-362. Voinchet, P., Despriée, J., Tissoux, H., Falguères, C., Bahain, J. J., Gageonnet, R., Dépont, J., and Dolo, J. M. (2010). ESR chronology of alluvial deposits and first human settlements of the Middle Loire Basin (Region Centre, France). Quaternary Geochronology 5, 381-384. ESR spectrum of gamma irradiated horse enamel from the Middle Palaeolithic archaeological site of Piégu (France) measured with a MiniScope MS 5000 benchtop ESR spectrometer (sample courtesy J.-J. Bahain, Muséum National d’Histoire Naturelle, Paris) Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Training and Application Expertise Maximize the Potential of Your Measurement Instruments Our training and application support ensure that you can fully leverage your instruments’ capabilities for precise and efficient measurements. Whether you need foundational training or advanced application insights, we provide flexible programs tailored to your expertise level. Our hands-on approach ensures that you gain practical skills, empowering you to optimize workflows, interpret data with confidence, and achieve consistent, high-quality results. Contact Us What We Offer Tailored Training Programs Hands-on sessions designed for beginners and advanced users, covering instrument operation, data interpretation, and best practices. On-Site and Remote Training Flexible training formats to fit your needs – at your location, at our facilities in Freiberg, or online. Application Consulting Expert advice on optimizing measurement techniques for your specific research or production processes. Understanding your instrument is key to unlocking its full potential. Our training programs empower users with the knowledge they need to achieve precise and reliable results. Pauline Taubert Application ESR Get Started Want to enhance your expertise? Contact us to discuss your training needs and find the right program for you. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com Discover more Customization Learn more Automation Learn more Research and Development Learn more Technical Support Learn more

Trap concentration determination Many lifetime measuring methods as QSSPC, µPCD or CDI, as well as MDP suffer from an anomalous high measured lifetime at very low injections. (Alttext kürzen, da zu lang) With the MDPmap and MDPingot it is possible to measure the photoconductivity as well as the minority carrier lifetime with one measurement and fully automated in a wide injection range. A clever algorithm allows the determination of the trap concentration in the sample. From the injection dependent lifetime curve the lifetime at low injection τ LLI can be determined and the photoconductivity is fitted with the slightly modified model of HORNBECK and HAYNES. The trapping density N T and the activation energy E A are the fitting parameters. First measurement results were obtained on mc- and Cz-Si wafers and a correlation between the trap density and the dislocation density could be confirmed. \(\Delta\delta = e[\tau_{LLI}G_{opt}(\mu_{n}+\mu_{p})+\Delta n_{T}\mu_{p}]\) MDPmap allows to measure injection dependent photoconductivity and lifetime curves with a high resolution, so that the trap density and activation energy of trapping centers can be determined. With this it is possible to investigate the origin of traps and there influence on for example the efficiency of solar cells. For more information read: [1] J. A. Hornbeck and J. R. Haynes, Physical Review 97, 311-321 (1955)[2] D. Macdonald and A. Cuevas, Applied Physics Letters 74, 1710 - 1712 (1999) [3] N. Schüler, T. Hahn, K. Dornich, J.R. Niklas, 25th PVSEC Valencia (2010) 343-346 Photoconductivity versus Gopt for different trap densities and fit of measured photoconductivity curve Related Solutions and Industries: Epitaxial Layers & Thin Films , Photovoltaic , Research and Development Matching Products MDP series MDPmap Precision Lifetime Charachterization with Exceptional Sensitivity Learn more MDP series MDPpro 850+ Advanced Solution for Quality Control of Monocrystalline Silicon Ingots, Bricks, and Wafers Learn more MDP series MDPpro Advanced Lifetime Measurement System for Quality Control and Material R&D on Semiconductors Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygresearch Configuration options Ultra-fast pulsing (< 10 ns) Ultra-fast pulsing (< 10 ns) Time Resolved Luminescence Interested? Get in touch! Contact now Module for fundamental studies on luminescence life-times and for separation of luminescence signals of different life-times by pulsed stimulation. Laser diode specifications: Rise/fall time: < 10 ns ON-Time: 50 ns to continuous wave Transient detection system: Time steps: 2.5 ns to 1 s Time point accuracy: < 50 ps Choice of logarithmic time scale over 7 decades (possibility of measurement of extremely short and extremely long time transients at a time) Measurement system exhibits no limitation in counting rate below 150 MHz

Unheated rock surfaces The last light exposure of rock surfaces can be dated for establishing the age of e.g. the construction and destruction of walls Granite or other quartz/feldspar containing rocks are preferentially dated with spatially resolved luminescence Marble, limestone surfaces are dated with Optically Stimulated Luminescence (OSL) as well as Thermoluminescence (TL) Spatially resolved luminescence is especially useful in this application with e.g. EMCCD-camera in lexsyg detector changer Greilich S & Wagner GA (2006) Development of a spatially resolved dating technique using HR-OSL. Radiation Measurements 41, 738-743. IRSL dating of the light exposure due to turning over of rocks which created the Nasca lines (Greilich & Wagner, 2006) Matching Products TL/OSL series lexsygsmart The most sensitive TL/OSL reader Learn more TL/OSL series lexsygresearch The most advanced TL/OSL reader Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygresearch Optional accessories Vacuum pump Vacuum pump To automatically evacuate the measurement chamber before creating a nitrogen atmosphere or for alpha irradiation Interested? Get in touch! Contact now Features Compact rotary vane pump Automatically controlled by the lexsyg device Low weight Low maintenance Includes all necessary seals, flanges and pipes

X-ray Diffraction Innovative Approaches to Crystal Orientation and Quality Assurance: The XRD series Freiberg Instruments specializes in manufacturing state-of-the-art X-ray diffractometers and automated in-line systems designed for crystal lattice orientation and sample alignment. Our ultra-fast and precise Omega-scan technology determines complete crystal orientations in just seconds. Enhance quality control with options like 2D (X-Y) or 3D mapping, rocking-curve measurements, and full automation, making our diffractometers indispensable for single crystal manufacturers. Capable of handling boules, ingots, wafers, bars, panels, rods, and more, our XRD devices deliver reliable performance in demanding production environments. Operating 24/7, our systems align crystals for sawing or grinding, locate flats or notches, and verify final products like wafers and blanks, ensuring unmatched precision and efficiency. XRD series Ingot XRD Learn more XRD series Wafer XRD Learn more XRD series Omega/Theta XRD Learn more XRD series DDCOM Learn more XRD series SDCOM Learn more XRD series XRD-OEM Learn more XRD series Quartz XRD Learn more XRD series Ingot XRD SiC Learn more XRD series Quartz Bar XRD Learn more XRD series Quartz Wafer XRD Learn more XRD series Quartz Blank XRD Learn more XRD series XRDmap Pro Learn more XRD series Angle Sorter Learn more We specialize in the ultra-fast and precise Omega-scan method, capturing all crystal orientation parameters in a single rotation within just 5 seconds. Dr. Ing. Hans-Arthur Bradaczek Head of X-ray Technology Discover more of the XRD series Applications Learn more Technology Learn more Software Learn more Publications Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com