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Characterization of Ga2O3 Aim Ga 2 O 3 is an ultra-wide band gap semiconductor with a great application potential. The contactless characterization of defect related transitions with high sensitivity

Company Innovation drives everything we do Driven by Innovation, Instruments Made to Measure We engineer and manufacture advanced measurement technologies and software solutions that redefine industry

Comparison between MPD and SPV techniques MDP (microwave detected photoconductivity): sensitive to moving photogenerated charge carriers (bulk property) SPV (surface photovoltage): sensitive to surfac

Comparison of PID Test Methods A comparison with other widely used methods for PID testing demonstrates that the PIDcon has some unneglectable advantages The PIDcon test has the following advantages c

Comparison to µ-PCD and QSSPC Among carrier lifetime experiments, it is still one of the biggest problems to understand widely contradicting results as obtained by different experimental methods. With

Conductance Test and Power Loss The conductance test and power loss are used to determine the pass/fail criteria for the PID test In order to establish an easy way to decide whether a solar cell or mi

Configuration options for lexsyg research Automatic detector changer The detector changer is fully automatic and software controlled. It can hold and change up to four different detectors like standar

Configuration options for lexsyg smart Irradiation sources The lexsyg TL/OSL reader can be equipped with up to 2 irradiation units. A sensor controlled mechanical shutter moved by air pressure provide

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