Search

XRD for large crystals, ingots and boules Samples with a wide variety of geometry & size Learn more Marking and measuring of in-plane directions Learn more Crystal quality Learn more NLO Materials: Crystal Quality & Optical Axis Orientation Learn more

XRD surface mapping Unlock Material Insights with XRD Surface Mapping X-ray diffraction (XRD) surface mapping is a powerful analytical technique widely used in material science, physics, chemistry, and engineering to characterize the crystalline properties and structural variations of materials across a defined surface. By systematically measuring diffraction patterns across different points on a sample’s surface, XRD surface mapping enables researchers to obtain detailed spatial information on crystallographic orientation, strain, phase distribution, and texture. This data is invaluable for applications ranging from thin-film analysis and semiconductor development to stress analysis in metals and composite materials. The ability to map these properties across a surface provides insights into uniformity, quality, and performance, making XRD surface mapping a critical tool in quality control, failure analysis, and research & development for advanced materials. Through this technique, scientists and engineers gain a deeper understanding of material behavior and can optimize properties for specific applications, driving innovation in industries such as electronics, aerospace, automotive, and biomedical engineering High-Resolution Crystallographic Mapping Non-Destructive Testing Real-Time Quality Control and Defect Detection Enhanced Performance Optimization Crystal Surface Orientation Mapping Learn more Automatic Wafer Sorting Learn more 3D Mapping of Crystalline Turbine Blades Learn more

Quartz crystal processing Quartz Bar Aligning Learn more Quartz Blank Sorting Learn more

Crystal Surface Orientation Mapping Surface mapping is key to identifying issues in crystal growth and manufacturing Precise Surface Orientation Mapping with Omega-Scan Even within a single crystal, slight variations in crystal orientation can occur across the surface, often due to internal strains from lattice defects. Similarly, well-grown thin films can display unique in-plane orientation distributions. Mapping such surfaces typically requires numerous measurements, and this is where the Omega-Scan method excels with its speed and efficiency. The image below illustrates an orientation map measured on a (Si, Ge) solid solution wafer, where the maximum orientation difference is just 0.03°. The concentric circles in the map correspond to the crystal’s growth rings, providing valuable insights into its structure. Related Technologies: Omega-scan , Theta-scan Related Solutions and Industries: Epitaxial Layers & Thin Films Matching Products XRD series Omega/Theta XRD for ultra-fast crystal orientation, crystal alignment in production, quality control, rocking curve measurements, material research and more Learn more XRD series XRDmap Pro Inline wafer orientation mapping truly fab compliant Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

3D Mapping of Crystalline Turbine Blades for Production and Quality Control Precise Orientation Measurement for Turbine Blade Quality The high-temperature creep resistance of turbine blades made from single-crystal NI-superalloys is influenced by the deviation from the target orientation. A customized XRD system, with its 3D mapping extension, accurately measures orientation deviations across the entire surface of the turbine blade. *A. Onyszko, J. Sieniawski, W. Bogdanowicz, H. Berger, "Two methods of studying structure perfection of single crystal nickel-based superalloy ", Solid State Phenomena, 203-204 (2013) 177-180 Related Technologies: Omega-scan , Theta-scan Related Solutions and Industries: Epitaxial Layers & Thin Films Matching Products XRD series Omega/Theta XRD for ultra-fast crystal orientation, crystal alignment in production, quality control, rocking curve measurements, material research and more Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Quartz Bar Aligning Pre-alignment of bars | Preparation for sawing process Precision Alignment & Efficient Sawing of Quartz Bars Quartz bars serve as the raw material for cutting high-quality blanks with precise temperature characteristics. Proper pre-alignment is essential to ensure optimal performance. To achieve accurate alignment in the saw, each quartz bar undergoes an individual X-ray measurement, as no two bars are identical. Once aligned, the bar is securely fixed using UV-curable adhesive in a process known as "UV curing." For maximum efficiency, multiple quartz bars are processed simultaneously. By stacking up to 30 bars in a single sawing step, productivity is significantly enhanced while maintaining precision and quality. Related Technologies: Omega-scan Matching Products XRD series Quartz Bar XRD Enable tight frequency specs in mass production Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Quartz Blank Sorting Sorting of quartz blanks for AT, SC, TF & IT cut Precision Quartz Blank Evaluation for Optimal Oscillator Performance Quartz blanks are the core component of oscillator devices, each resonating at a specific frequency. The stability of this frequency under varying temperatures is determined by the quartz's cutting angle. X-ray diffraction (XRD) technology enables precise detection and assessment of this critical quality factor. In a fully automated process, quartz blanks are sorted into quality categories, ensuring only the best materials are selected. With handling and measurement times as fast as 3 seconds per sample, the system delivers exceptional throughput for high-efficiency production. Related Technologies: Omega-scan Matching Products XRD series Quartz Blank XRD Enable tight frequency specs in mass production Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Automatic Wafer Sorting For microelectronics, and other microstructure technologies, crystalline wafers High-Precision Wafer Testing with Omega-Scan To ensure the exceptional performance required for semiconductors, every wafer must undergo thorough testing. The Omega-Scan method, known for its speed and precision, is ideal for fully automated in-line X-ray diffraction (XRD) solutions. It enables comprehensive surface characterization, including surface tilt vector analysis and in-plane direction measurement—such as perpendicular alignment to the wafer flat. Additionally, it provides automated detection of wafer flats or notches along with their precise measurements. Omega-Scan solutions are available for all standard wafer materials and orientations. Quartz remains the most commonly used material, where integrating mapping technology proves especially beneficial. By identifying high-quality wafer regions before cutting blanks, the process ensures optimal material utilization. During wafer production, heat-induced stress can cause bending, leading to warp and bow. See Fig 1 & 2. An optional sensor accurately measures these deformations, ensuring precise quality control. Fig. 1 - Warp and bow measument with a line laser instrument attached to the diffractometer Fig. 2 - Sapphire wafer surface geometry as the result of the warp and bow measurement Related Technologies: Omega-scan , Theta-scan Related Solutions and Industries: Epitaxial Layers & Thin Films Matching Products XRD series Wafer XRD for fully automated sorting, sample crystalline orientation, sample dimension, optical notch/flat and edge profile determination and more Learn more XRD series Quartz Wafer XRD Enable tight frequency specs in mass production Learn more XRD series Angle Sorter This product launching soon Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Marking and measuring of in-plane directions with Omega-scan Efficient Crystal Orientation and In-Plane Direction Measurement with Omega Scan The Omega Scan provides a complete crystal orientation in a single measurement, allowing for the direct identification of in-plane directions. This feature is particularly useful for marking in-plane directions or verifying the orientation of flats and notches. During wafer implantation and photolithography, the flat or notch acts as an orientation marker. After processing, the wafer contains hundreds of chips that must be separated by cleaving. Correct alignment of these chips with a lattice plane is crucial for easy cleaving, making it necessary to check the position of the flat or notch. This requires precise measurement of in-plane components. Unlike the more complex or imprecise Theta Scan method, Omega Scan accurately measures the complete orientation in one go. The system also allows for easy adjustment of any in-plane direction to a specific position defined by the user, simplifying tasks such as flat orientation marking. For high-throughput applications, automated measurement solutions are available, ensuring maximum efficiency. Related Technologies: Omega-scan Matching Products XRD series DDCOM Ultra-fast, bottom surface measuring crystal orientation in a compact package Learn more XRD series SDCOM Ultra-fast, top surface measuring crystal orientation in a compact package Learn more XRD series Omega/Theta XRD for ultra-fast crystal orientation, crystal alignment in production, quality control, rocking curve measurements, material research and more Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

NLO Materials Crystal Quality & Optical Axis Orientation Non-Linear Optical (NLO) Materials Unlike typical inorganic metals, semiconductors, and insulators, NLO materials feature more complex crystal structures with lower symmetry. This structure creates a highly anisotropic environment for light passing through the crystal, resulting in unique optical properties. These crystals are typically cut into small bars, with millimeter-scale dimensions, to serve as active components in frequency multipliers and optical parametric oscillators. Surface quality analysis of these small crystals can reveal structural defects and cracks. The large unit cells of NLO materials present a challenge for measurement, but the Omega Scan method has been successfully adapted to determine key parameters for important NLO materials like LBO, BBO, and TeO 2 . Special modifications to the Omega/Theta design enable NLO capabilities across a variety of materials, ensuring precise and reliable analysis. Related Technologies: Omega-scan Matching Products XRD series SDCOM Ultra-fast, top surface measuring crystal orientation in a compact package Learn more XRD series Omega/Theta XRD for ultra-fast crystal orientation, crystal alignment in production, quality control, rocking curve measurements, material research and more Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com