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Electronic transitions in diamond Aim For further development of optoelectronic devices and other applications based on diamond and nanodiamond, contactless characterization of electronic defect states and electronic transitions in bulk diamond and at diamond surfaces over a wide spectral range is of great interest. Solution Contactless surface photovoltage (SPV) spectroscopy in the Kelvin probe (direct measurement of the contact potential difference, DCPD) and modulated regimes provides information about transitions energies and direction of charge separation in a spectral range from near infrared (< 0.5 eV) up to the deep ultraviolet (> 6 eV) at high sensitivity. Application example Diamond has an ultra-wide indirect band gap of 5.47 eV [1]. Figure 1 shows the DCPD spectrum and its derivative for a polycrystalline diamond sample prepared by CVD. Transitions related to excitation via defect states and transitions around the band gap can be clearly distinguished [2]. For the modulated SPV spectra of another diamond sample, the sensitivity is increased and transitions at 5.258 and 5.544 eV related to absorption assisted by the indirect exciton and transversal optical phonon are well pronounced. Related spectra are like fingerprints and can be used, for example, for inline control in production lines. References [1] C. D. Clark, P. J. Dean, P. V. Harris, “Intrinsic edge absorption in diamond”, Proc. R. Soc. London A 277, 312 (1964). [2] Th. Dittrich and S. Fengler, “Transitions in polycrystalline diamond probed by surface photovoltage spectroscopy”, to be submitted. Figure 1: Spectra of DCPD and its deriva-tive for polycrystalline CVD diamond (data after [2]). Onsets at major defect transitions and around the band gap. Fig. 2: In-phase and phase-shifted by 90° modulated SPV spectra of a diamond crystal. Dotted lines give defect related transitions and transitions Eg - Ex ± hvTO. Related Solutions and Industries: Epitaxial Layers & Thin Films Matching Products SPS/SPV series HR-SPSmap with fixed energy excitation sources High-Resolution and Sensitive Surface Photovoltage Measurement Solutions Learn more SPS/SPV series HR-SPSmap with variable energy excitation source with a variable energy excitation source Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Epitaxial Layers & Thin Films Guaranteeing specifications in Semiconductor front-end processes Analyze wafer properties during wafering and front-end processes Near-surface wafer properties play a crucial role in determining the outcomes of subsequent processes. Tight control over structural and electronic conditions is essential to prevent yield loss during this critical phase. Using XRD series , you precisely control crystal cuts, ensuring consistent quality for device processing every day. With MDP series and HR-SPS series , you monitor the recombination behavior of optically generated charge carriers. This approach supports a wide range of applications, from optoelectronics to power and logic devices! Key Advantages Manual or automated Whether for R&D or Quality Control, we offer the flexibility to integrate metrology units with automation solutions or design cost-efficient, streamlined standalone systems. Highest precision Our unmatched combination of precision, speed, and modularity sets us apart. Put our method to the test with your application – challenge us to deliver! Material flexibility We offer solutions for almost any thin film or bulk material system with a band gap. Challenge us with your process requirements – we're ready to innovate! Onsite service and training Reduce your total cost of ownership by participating in our on-site training program! We empower you to perform first- and second-line servicing on your tools, ensuring maximum uptime and full control over your process – no matter your location or access limitations. Offcut management for front-end processes Implement 100% wafer offcut entry control for your front-end processes. This enables you to screen offcuts from materials like SiC or InP substrates, ensuring optimal results in epitaxy, lithography, and ion implantation. Single crystal rocking curve With an optional module, you can activate an essential X-ray metrology feature. Perform baseline quality control using X-ray rocking curves and analyse the FWHM of SiC wafers. Our Industry-Leading Solutions XRD series Explore more SDCOM Learn more Wafer XRD Learn more Omega/Theta XRD Learn more MDP series Explore more MDPmap Learn more MDPspot Learn more MDpicts Learn more MDpicts pro Learn more HTpicts Learn more SPS/SPV series Explore more HR-SPSmap with fixed energy excitation sources Learn more HR-SPSmap with variable energy excitation source Learn more DPM series Explore more DPM100 Learn more Expertise in Materials Si SiC InP GaAs Ga₂O₃ Ge and more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com Discover More Solutions Crystal Growth and Processing Learn more Photovoltaic Learn more Luminescence Dating and Dosimetry Learn more Research and Development Learn more

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Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygresearch Configuration options Filter wheel Filter wheel including suitable filters Interested? Get in touch! Contact now Filter wheel including suitable filters, which are optimized for maximized luminescence light collection and maximum suppression of scattered light (OSL, PL) and thermal noise (TL), recommended as minimum configuration to perform optimized TL/OSL/RF analyses in dating and other applications. Optics designed for high-efficiency light collection for PMT luminescence measurements Programmable change of detection window (duration of filter change between 300 ms and maximum 3s) during measurement Filter choice is software restricted according the chosen stimulationwavelength, thus malfunction (over exposure) is prevented Malfunctions are software protected, including PMT damage protection during measurement Optimized filter-sets for all main quartz or feldspar mineral luminescence emissions and for other materials/applications are available Filter sets (interference, color-glass optical filters) optimized for largest transmission of individual wavelength bands and best blocking of stimulation light (OSL) and/or thermal noise (TL, blackbody radiation) A filter wheel has 6 position and each position up to 6.5 mm of stacked filter thickness. 15 measurement functions are included (more information are available on request)

Flint and other heated rocks When rocks have been heated in antiquity the time of the last exposure to high temperatures can be determined Rocks containing amorphous/microcrystalline SiO 2 can be dated by luminescence methods when they have been heated to approximately 400°C. Such temperatures, whether accidentally or deliberately, are easily achieved in hearths and therefore the dated event relates to the heating of the flint in a prehistoric fire. Quartz pebbles or sandstone with Optically Stimulated Luminescence (OSL) Flint, chert, hornstone, sandstone, quartz pebbles with Thermoluminescence (TL) Establishing chronostratigraphies for the Palaeolithic period (e.g. Valladas et al., 2013) Applicable for almost the entire time span of human use of fire Overview with specific application details for heated flint can be found in Richter (2007) Orange-red TL detection allows the use of SAR protocols with increased performance of red-enhanced PMT in lexsyg devices Richter D (2007) Advantages and limitations of thermoluminescence dating of heated flint from Paleolithic sites. Geoarchaeology 22, 671-683. Valladas H, Mercier N, Hershkovitz I, Zaidner Y, Tsatskin A, Yeshurun R, Vialettes L, Joron J-L, Reyss J-L & Weinstein-Evron M (2013) Dating the Lower to Middle Paleolithic transition in the Levant: A view from Misliya Cave, Mount Carmel, Israel. Journal of Human Evolution 65, 585-593. For heated flint dating the sum of the regression results of additive and regeneration TL growth curves provide the palaeodose TL glow curves detected in the orange-red wavelength band on a lexsyg research with standard bi-alkaline and red-enhanced photomultiplier tubes. (Note: these fine grain quartz aliquots were very reproducible and no normalisation was required) Matching Products TL/OSL series lexsygsmart The most sensitive TL/OSL reader Learn more TL/OSL series lexsygresearch The most advanced TL/OSL reader Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Food Irradiation Control using TL and PSL/OSL techniques European standards DIN EN 13751 | DIN EN 1788 Food stuff often is irradiated with ionizing radiation for sterilisation purposes. This requires the detection and estimates of the applied doses. The attached mineral dust or the food itself serves as dosimeter. TL/OSL to detect irradiation of e.g. spices Presence/absence of signal specific features shows the irradiation Dose estimates are possible for some materials Jo, Y., Sanyal, B., Chung, N., Lee, H.-G., Park, Y., Park, H.-J., and Kwon, J.-H. (2015). Calibrated photostimulated luminescence is an effective approach to identify irradiated orange during storage. Radiation Physics and Chemistry 111, 81-86. Photo Stimulated Luminescence (PSL) Learn more about our product PSLfood Silicate minerals contained in food according EN 13751 Spices (dust attached to spices) Shrimps (intestines contain dust/sand) Shells (crushed) Thermoluminescence (TL) Learn more about our TL/OSL reader: lexsyg research and lexsyg smart Silicate minerals extracted from food according to EN 1788 Spices (dust attached to spices) Herbs (dust attached to herbs) Seafood Xray Dose For a detection of food irradiation with luminescence methods (EN1788, EN13751) the food has to be irradiated in the laboratory for comparison. The large doses required are achieved with the Xray Dose irradiator. Matching Products TL/OSL series PSLfood For checking irradiated food according to EN 13751:2009 standard Learn more TL/OSL series lexsygsmart The most sensitive TL/OSL reader Learn more TL/OSL series TLDcube A modern TLD reader by Freiberg Instruments Learn more TL/OSL series lexsygresearch The most advanced TL/OSL reader Learn more Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com

Driving efficiency and accuracy with our automation and metrology expertise Bringing Innovation from Lab to Fab At Freiberg Instruments, we drive technological advancements by developing high-precision measurement and automation solutions that set new industry benchmarks. Our systems enable leading companies and researchers to enhance their processes and gain reliable data for breakthrough innovations. With over 3,000 metrology systems installed worldwide , we serve industries such as microelectronics, semiconductors, photovoltaics, chemicals, and medical technology. Our dedication to quality—certified according to ISO 9001:2015 – makes us a trusted partner for future-driven solutions. Our goal: transforming innovation from the lab into industrial applications—efficiently, precisely, and sustainably. Learn more about us Cutting-edge Metrology Solutions for Various Applications Crystal Growth and Processing Our advanced X-ray diffraction (XRD) systems optimize grinding and sawing processes, ensuring perfect alignment for high-performance semiconductor applications. Discover more Epitaxial Layers and Thin Films Our non-destructive metrology tools provide critical insights into wafer properties, layer thickness, and defect detection. Discover more Photovoltaic Our advanced tools support high-speed, high-accuracy analysis of wafers and thin films, ensuring optimal yield and production performance. Discover more Luminescence Dating and Dosimetry Our instruments provide unparalleled sensitivity and reliability in geochronology and dosimetry applications. Discover more Radiation Monitoring Our solutions provide real-time monitoring, ensuring compliance and protection in critical industrial and research environments. Discover more Research and Development Our advanced metrology tools support material research, semiconductor development, and defect analysis with maximum accuracy. Discover more Precision Redefined: Discover Our Advanced Metrology and Automation Solutions XRD series Advanced X-Ray diffractometers Devices for crystal orientation, sample alignment & quality control Learn more RES series Resistivity Mapping Accurate material analysis for semiconductor quality control Learn more MDP series Microwave Detected Photoconductivity Contactless mapping of key electrical semiconductor parameters Learn more SPS/SPV series Surface Photovoltage Spectroscopy Contactless characterization of key electro-optical material parameters Learn more DPM series Double Prism Monochromator Unlock the future of spectral analysis Learn more PID series Potential Induced Degradation Advanced Solutions for PID Detection and Quality Control in Solar Cells & Module Learn more TL/OSL series Luminescence Dating and Dosimetry Advanced luminescence systems for geology, archaeology, and radiation dosimetry Learn more RMS series Radiation Monitoring System Protecting people, workspaces, and the environment with precision Learn more Ramses series Raman Sensor Fully automated, high sensitive for polymer and semiconductor sorting Learn more We are driven by Innovation. Freiberg Instruments constantly redefines the limits. Excellence in Automation and Metrology is our core motivation. Dr. Kay Dornich CEO Services for Your Success From tailored solutions to expert training and responsive technical support, our services are designed to keep your operations running smoothly and efficiently. Discover our services Customization Automation Research and Development Training and Application Expertise Technical Support Latest News 11/05/2024 HZB patent for semiconductor characterisation goes into serial production 12/07/2023 Collaboration Announcement: Freiberg Instruments and Ajuba 11/21/2023 A precision better than 1% is achievable with lexsygsmart luminescence reader More News Upcoming Events More Events Driving Innovation with You Our team of engineers, scientists, and professionals shares a relentless passion for excellence. Together, we have built a reputation for reliability, innovation, and exceptional customer service. We constantly redefines the limits of metrology. Meet the Team Career Opportunities Thesis and Internship Discover more About Freiberg Instruments Get to know us We assist you with any inquiries or requests Contact us

Geology Optically stimulated Luminescence dating of quartz (OSL) Learn more Infrared stimulated Luminescence dating of feldspar (IRSL) Learn more Single grain/spatially resolved luminescence dating Learn more Radiofluorescence Learn more Electron Spin Resonance (ESR) dating of quartz Learn more Pulsing: mixed mineral samples Learn more