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Contactless characterization of SiC, GaN and AlGaN Aim SiC, GaN and AlGaN belong to the class of wide band gap semiconductors and are applied especially in power electronics, optoelectronic devices an

Contactless detection of bulk polarization phenomena in semiconductors Aim Characterization of bulk polarization phenomena such as the bulk photo-voltaic effect (BPVE) in semiconductors requires the p

Crystal Growth and Processing Solutions for Unrivaled Precision in Crystal Orientation Enhancing Accuracy in Grinding and Sawing: Optimize your Crystal Processing Freiberg Instruments sets new standar

Crystal Surface Orientation Mapping Surface mapping is key to identifying issues in crystal growth and manufacturing Precise Surface Orientation Mapping with Omega-Scan Even within a single crystal, s

Measuring Crystal Quality Through XRD Reflection Analysis Assessing Crystal Quality via XRD Reflection Analysis Crystal quality cannot be directly measured, but several physical properties can be asse

Customization Tailored Measurement Solutions for Unique Challenges Solutions Built for Your Needs At Freiberg Instruments, we understand that standard solutions may not always fit your specific requir

Defect properties For the efficiency of solar cells the properties of a defect and its impact on the material quality are of great importance. Defect properties The properties of a defect and its impa

Defects and charge dynamics in 3C- and 4H-SiC investigated by surface Photoelectrochemical (PEC) and photocatalytic (PC) water splitting for hydrogen and/or oxygen generation is leading the way not on