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Radiation Monitoring System Cutting-Edge Technology for Accurate Radiation Detection and Measurement We are dedicated to delivering state-of-the-art radiation monitoring systems that cater to the vari

Physical Nature of PID-s PID-s is a major threat to c-Si modules, with significant progress made in understanding its mechanisms In the field a large potential between the front glass surface and the

Diffusion length Diffusion length The diffusion length is the average distance that the excess carriers can cover before they recombine. Diffusion length depends on the lifetime and mobility of the ca

Static, transient or modulated light excitation pro and con The time-resolved or frequency-modulated, surface photovoltage spectroscopy (SPS) is based on a time-resolved/frequency modulated measuremen

SPV signal analysis: fits and simulations Charge dynamic simulations in photoactive materials, incl. heterojunction photoactive materials. We are currently developing simulation tools to enable first

SPV-Picts SPV temperature dependence measurements Use this option to make SPV measurements at different temperatures between room temperature and 200°C. Temperature-dependent SPV measurements can be a

Comparison between MPD and SPV techniques MDP (microwave detected photoconductivity): sensitive to moving photogenerated charge carriers (bulk property) SPV (surface photovoltage): sensitive to surfac

Electrical and optical characterization using SPV/Kelvin Photocarrier generation and separation mechanisms Minority carrier lifetime measurement/Diffusion length calculations Trapped carrier dynamics,

Comparison of PID Test Methods A comparison with other widely used methods for PID testing demonstrates that the PIDcon has some unneglectable advantages The PIDcon test has the following advantages c

Materials Any photoactive material from raw material to finished device: From powder-based samples over wafers to boules or ingots. From 10 x 10 mm 2 and up to 300 mm diameter From titanium dioxide ov