Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Surface Photovoltage Spectroscopy HR-SPSmap with fixed energy excitation sources HR-SPSmap High-Resolution and Sensitive Surface Photovoltage Measurement Solutions Interested? Get in touch! Contact now Product Sheet Skip menu Quick navigation Features Applications Specifications Technology Options Contact Enables advanced material research for thin layers and surfaces: destruction free, flexible and fast Highly sensitive due to an advanced electronic detection system Customized lasers and optics for up to 4 different wavelengths Investigation of charge separation processes and electronic transitions (defects) Materials Si SiC Ge GaAs Ga₂O₃ InP Diamond and more Features & Benefits 355–1550 nm Available wavelengths 10 ns Time resolution 0.1 mm Spatial resolution < 5 min Throughput for 8’’ wafer < 5 min Throughput for 8’’ wafer Sensitivity: sub-mV sensitivity and more than 3 orders of magnitude signal height resolution Measurement speed: < 5 minutes for a 150 mm wafer with 1 mm resolution Time resolution: 10 ns up to 100 ms Optical head: Up to 4 light sources integrated into the optical head or fixture for mounting of external lasers – build-in suppression of stray light Reliability: modular and compact bench top instrument for high reliability and uptime > 99% Flexible Mapping Tool for R&D and Production Monitoring The HR-SPSmap product platform builds on the proven foundation of the widely acclaimed MDPmap series. This compact, benchtop, contactless electrical characterization tool is specifically designed for offline production control and research and development applications. It measures surface photovoltage (SPV) across a wide injection range, accommodating both steady-state and short-pulse excitation. With automated sample recognition and parameter setup, it effortlessly adapts to a diverse range of samples, including epitaxial layers and wafers at various stages of processing, from as-grown material to fully fabricated devices. Exceptional Flexibility and Advanced Features One of the standout advantages of the HR-SPSmap is its exceptional flexibility. Equipped with fixed-energy excitation sources, the system supports the integration of up to four lasers within the measurement head. This capability facilitates injection-level-dependent SPV measurements across a broad range, from very low to high injection levels, and enables depth profiling using different laser wavelengths. The system also includes a bias light feature for enhanced measurement options. In addition, the HR-SPSmap supports custom calculations and mapping configurations, along with the ability to export primary data for detailed external analysis. For standard metrology tasks, the platform offers a predefined recipe system, allowing routine measurements to be completed with a single button press. Unlock Precision and Adaptability With its advanced capabilities and user-friendly design, the HR-SPS is the ideal solution for researchers and production teams seeking high-precision surface photovoltage measurements. Whether for R&D innovation or reliable production monitoring, this platform redefines flexibility and efficiency in electrical characterization. Applications Defects and charge dynamics in 3C- and 4H-SiC investigated by surface Photoelectrochemical (PEC) and photocatalytic (PC) water splitting for hydrogen and/or oxygen generation is leading the way not only to green hydrogen production, but also to oxygen generators… Learn more Defects in 4H-SiC Silicon carbide (SiC) high power, high voltage semiconductor devices lead the way not only for superfast chargers and on-board chargers for electrical vehicles (EV), but also power drive trains… Learn more Contactless characterization of SiC, GaN and AlGaN Aim SiC, GaN and AlGaN belong to the class of wide band gap semiconductors and are applied especially in power electronics, optoelectronic devices and transistors such as HEMTs (high electron… Learn more Study and monitoring of photocatalytic materials (TiO2) Aim Photocatalytic materials such as TiO2 are of great interest, for example, for cleaning of industrial wastewater and for water splitting. The identification of directed charge transfer is… Learn more Investigation of photocatalytic materials (BiVO4) Aim Photocatalytic materials such as BiVO4 are of great interest, for example, for water splitting. Electronic defect states and surface passivation are important limiting factors. Photocatalytic… Learn more Silicon photovoltaic – Wafer check after diamond wire sawing Diamond wire sawing (DWS) is an established technology for wafering semiconductor ingots, as it has many advantages over other technologies, such as of slurry cutting. Some of these advantages… Learn more Characterization of Ga2O3 Aim Ga2O3 is an ultra-wide band gap semiconductor with a great application potential. The contactless characterization of defect related transitions with high sensitivity is still… Learn more Electronic transitions in diamond Aim For further development of optoelectronic devices and other applications based on diamond and nanodiamond, contactless characterization of electronic defect states and electronic transitions… Learn more Contactless detection of bulk polarization phenomena in semiconductors [1] Levine, I. et al. "Bulk photovoltaic effect in carbon-doped gallium nitride revealed by anomalous surface photovoltage spectroscopy." Phys. Rev. B 101 (2020) 245205. Learn more Interested? Our experts are happy to assist you. Get in touch! Contact us now! Technical specifications sample size powder samples up to 300 mm diameter excitation select up to four different wavelengths from 337 nm up to 1550 nm (default 980 nm) material any photoactive material (contact us for consultation on your material) measureable time-resolved surface photovoltage measurements dimensions 680 x 380 x 450 mm, weight: app. 65 kg power 100 - 250V, 50/60 Hz, 5 A resolution 100 µm Technologies Electrical and optical characterization using surface photovoltage spe Photocarrier generation and separation mechanisms, Minority carrier lifetime measurement/Diffusion length calculations, Trapped carrier dynamics, time resolved, Surface Photovoltage… Learn more SPV signal analysis: fits and simulations We are currently developing simulation tools to enable first principle calculations of the electronic structure in a given photoactive material or material combination, based on solid-state… Learn more Comparison between MPD and SPV techniques MDP (microwave detected photoconductivity): sensitive to moving photogenerated charge carriers (bulk property), SPV (surface photovoltage): sensitive to surface AND bulk properties with respect… Learn more Static, transient or modulated light excitation pro and con The time-resolved or frequency-modulated, surface photovoltage spectroscopy (SPS) is based on a time-resolved/frequency modulated measurement of the spectral dependence of the surface… Learn more SPV-Picts SPV temperature dependence measurements Use this option to make SPV measurements at different temperatures between room temperature and 200°C. Temperature-dependent SPV measurements can be applied to measure activation energies or to… Learn more Materials Any photoactive material from raw material to finished device:From powder-based samples over wafers to boules or ingots. From 10 x 10 mm2 and up to 300 mm diameter, From titanium dioxide over… Learn more Accessories & Options Our devices offer versatile configuration options to meet specific requirements effectively. Each model can be customized to ensure maximum flexibility and efficiency. Contact for more information Wide range of laser light sources from 337 nm up to 1550 nm Integrated heating stage (20-250°C) Spot size variation Bias light Resistivity measurement (wafers) Reference wafer (Si) Get in touch Do not hesitate to contact us – we are available to assist you with any inquiries or requests. Use our inquiry tool or reach out via email: sales @ freiberginstruments.com
