Search

Marking and measuring of in-plane directions with Omega-scan Efficient Crystal Orientation and In-Plane Direction Measurement with Omega Scan The Omega Scan provides a complete crystal orientation in

Martin Ferkinghoff Head of Service Freiberg Instruments is the right place for you if you enjoy achieving milestones as part of a team, remain curious and have a desire for change. Martin Ferkinghoff

Materials Any photoactive material from raw material to finished device: From powder-based samples over wafers to boules or ingots. From 10 x 10 mm 2 and up to 300 mm diameter From titanium dioxide ov

Materials Electrical properties and defects of a large variety of semiconductor materials, devices and dielectric materials can be investigated contact less and destruction free with our advanced meth

Medical dosimetry Radiotherapy, diagnostic radiology, nuclear medicine Medical dosimetry Ionizing radiation from a large variety of isotopic sources, as well as accelerators, electron beams, etc. are

Microwave Detected Photo Induced Current Transient Spectroscopy (MD-PICTS) is a modification of MDP, where temperature dependent measurements of the defect part of the transient are accomplished. In o

Microwave Detected Photoconductivity Unlock material insights with µPCD/MDP(QSS) – High-resolution, contactless measurement solutions for research and production: The MDP series Visualization of semic

Microwave detected photoconductivity The advanced method MDP is suited for defect investigation and mapping of wafers and ingotsWith its extraordinary sensitivity, resolution and speed MDP enables inj

Mini-module Classification The PIDcon benchtop system offers fast, cost-effective routine quality control for mini-modules' PID susceptibility, without the need for a climate chamber Potential Induced

Minority carrier Lifetime maps on 450 mm wafers Since several years, the microelectronic industry is planning to enlarge the wafer size from 300 mm (12 inch) to 450 mm (18 inch) diameter, in order to