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Application

Glass Evaluation

Glass Evaluation Glass resistivity is key to PID susceptibility and must be tested independently from the solar cell and EVA Since the PV community recognized the PID issue, extensive research has sho
Product

HR-SPSmap with fixed energy excitation sources

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Surface Photovoltage Spectroscopy HR-SPSmap with fixed energy excitation sources HR-SPSmap High-Resolution and Sensitive Surface Pho
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HR-SPSmap with variable energy excitation source

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Surface Photovoltage Spectroscopy HR-SPSmap with variable energy excitation source HR-SPSmap with a variable energy excitation sourc
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HTpicts

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Microwave Detected Photoconductivity HTpicts HTpicts Advanced High-Temperature Lifetime Measurement System for In-Depth Material Ana
Application

High precision Resistivity Measurement

High precision Resistivity Measurement on highly doped semiconductors Aim Measuring resistivity in highly doped semiconductors is crucial for several reasons: Quality control and Doping density verifi
Application

Highly spatial resolved inline metrology on Multicrystalline Silicon

Highly spatial resolved inline metrology on Multicrystalline Silicon The minority carrier lifetime is a key parameter for the performance of solar cells. Therefore it is a suitable criterion for class
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Imprint/Disclaimer

Imprint/Disclaimer Freiberg Instruments GmbH Delfter Str. 6 09599 Freiberg Saxony, Germany Contact Mr. Ing. Thanga Kumar +49 3731 419 54 0 sales @ freiberginstruments.com Authorized representative, re
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InfraRedPhotoLuminescence (IRPL)

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products Luminescence Dating and Dosimetry lexsygresearch Configuration options InfraRedPhotoLuminescence (IRPL) InfraRedPhotoLuminescence (I
Application

Infrared stimulated Luminescence dating of feldspar (IRSL)

Infrared stimulated Luminescence dating Many types of sediment do not contain quartz and for dating the light exposure to light of such sediments Infrared stimulated Luminescence (IRSL) is used. Due t
Product

Ingot XRD

Skip breadcrumb navigation Breadcrumb Freiberg Instruments Products X-ray Diffraction Ingot XRD Ingot XRD OD/Notch Enables existing equipment to reach high-end OD/Notch specs for 200 mm and 300 mm ing